Perovskites have emerged as a breakthrough material in optoelectronics, especially where solar cells and light-emitting devices are concerned. Their unparalleled light absorption and charge transport properties make them a key focus of today’s research.
Advanced characterization techniques are crucial to better understanding how perovskite materials are developed. CRAIC Technologies has shown how well its UV Visible-NIR microspectroscopy performs in the detailed examination of perovskite materials, offering deeper insights into their optical and electronic properties at the microscale.
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UV-Visible-NIR Microspectroscopy: An Overview
UV-Visible-NIR microspectroscopy incorporates the principles of UV-Vis spectroscopy in combination with high-resolution microscopy. This technique facilitates the analysis of materials across a broad spectral range (ultraviolet to near-infrared) at microscopic spatial resolutions.
CRAIC Technologies’ microspectroscopy systems come equipped with state-of-the-art optics and detectors, allowing researchers to precisely measure absorbance, reflectance, and photoluminescence spectra at sub-micron scales.
Key Findings in Recent Perovskite Research
Recent studies that have leveraged the power of CRAIC Technologies' UV-Visible-NIR microspectroscopy have managed to make significant progress in the characterization of perovskites.
1. Enhanced Optical Absorption and Reflectance Mapping:
Researchers have frequently applied this method to map the optical absorption of perovskite thin films, single crystals, and nanostructures alike.
2. Flexible Optoelectronic Device Development
Steady-state optical characterization of flexible devices with an active layer of ultrathin single-crystalline perovskite film supported the demonstration of high-performance flexible photodetectors.1
3. Development of Stable Infrared Photodetectors
Perovskites demonstrate good potential when it comes to developing cost-effective infrared (IR) photodetectors. However, when exposed to prolonged IR wavelengths, they tend to show signs of degradation. New, stable IR photodetectors have been developed and characterized using absorbance microspectroscopy.2
4. Engineering of Perovskite Optical Emissions
Metal halide perovskite quantum dots possess exceptional photoluminescence properties. Here, adaptable luminescence properties were engineered and the polarization reflectance microspectroscopy was applied for characterization of the samples.3
5. Building Near-infrared Nanolasers
Near infrared nanolasers are currently in development for use in optoelectronic circuitry. UV-Visible-NIR microspectroscopy is being used to measure the absorbance spectra of the new classes of wavelength tunable planar nanomaterials.4
6. Creating Two-Dimensional Semiconductors
Reflectance and transmission microspectroscopy can be applied to characterize the optoelectronic properties of two-dimensional tin perovskite crystals in sequence at the same location for each point to establish a relationship between the absorption spectrum and wavelength.5
Advantages of CRAIC Technologies’ Microspectroscopy Systems
- High Spatial Resolution: Facilitates in-depth mapping and analysis of microscopic features within perovskite samples.
- Broad Spectral Range: Covers UV to NIR regions, offering complete optical characterization.
- Multiple Measurement Techniques at the Same Location: Absorbance, reflectance and emission spectra can all be acquired at the same points, facilitating direct comparisons of results.
- Mapping of Surfaces: Absorbance, reflectance, emission spectra as well as thin film thickness maps are possible.
- Non-Destructive Analysis: Ensures delicate perovskite remain intact materials during measurement.
- Versatility: Applicable to an extensive range of perovskite materials and device assemblies.
Conclusion
CRAIC Technologies' UV-Visible-NIR microspectroscopy has shown itself to be a practical tool with the power to characterize perovskite materials at an advanced level. The capability to conduct detailed optical analysis at the microscale improves the understanding of perovskite materials' properties, accelerating the advances in perovskite-based technologies. Researchers and developers can use this technique to improve material quality, optimize device performance, and accelerate the commercialization of perovskite optoelectronics.
References
- Jing, Hao, Ruwen Peng, Ren-Min Ma, Jie He, Yi Zhou, Zhenqian Yang, Cheng-Yao Li et al. "Flexible ultrathin single-crystalline perovskite photodetector." Nano letters 20, no.10 (2020): 7144-7151.
- Kim, Min‐Woo, Yihang Yuan, Sehee Jeong, Jenny Chong, Håvard Mølnås, Aida Alaei, Iver J. Cleveland et al. "Electrospun Tri‐Cation Perovskite Nanofibers for Infrared Photodetection." Advanced Functional Materials 32, no. 45 (2022): 2207326.
- Csányi, Evelin, Yan Liu, Soroosh Daqiqeh Rezaei, Henry Yit Loong Lee, Febiana Tjiptoharsono, Zackaria Mahfoud, Sergey Gorelik et al. "Engineering Perovskite Emissions via Optical Quasi-Bound-States-in-the-Continuum." arXiv preprint arXiv:2306.14229 (2023).
- Zhang, Qing, Son Tung Ha, Xinfeng Liu, Tze Chien Sum, and Qihua Xiong. "Room- temperature near-infrared high-Q perovskite whispering-gallery planar nanolasers." Nano letters 14, no. 10 (2014): 5995-6001.
- Li, Yahui, Hongzhi Zhou, Ming Xia, Hongzhi Shen, Tianyu Wang, Haikuo Gao, Xin Sheng et al. "Phase-pure 2D tin halide perovskite thin flakes for stable lasing." Science Advances 9, no. 32 (2023): eadh0517.
This information has been sourced, reviewed and adapted from materials provided by CRAIC Technologies.
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