The M4 TORNADO is the instrument of choice for small-spot micro-XRF analysis. The M4 TORNADO provides information in the form of a spectral map of the elements present in a sample and their distribution. The system is also able to collect sub-surface information for chip and thin film analysis.
- Intense X-ray beam with a polycapilary lens providing a spot size of less than 20 μm
- High-speed data collection at 100 mm/s with a minimum dwell time per pixel of one millisecond
- XMethod software can be used to measure and analyze multilayer systems of up to 12 layers
In addition to spectral mapping via 2D area scans the M4 TORNADO can also be used to take fast point and line measurements of any sample type – whether organic or inorganic, solid or liquid.
A polycapillary lens with a small spot size and a high-intensity X-ray tube is used by the M4 TORNADO for primary X-ray excitation. The spectrometer can be configured to work with a wide range of XFlash® silicon drift detectors (SDD), allowing for high throughput without sacrificing the resolution. The additional X-ray tube, which allows for multiple targets, and a collimator switcher means even more extensive analyses can be carried out.
Further customization is possible such as the inclusion of a Helium-purge option to increase the detection of light elements, a quick-exchange stage for switching samples and a geo-sample holder for thin sample sections and drill cores. In addition, XMethod software, for the determination of layer thickness and quantifications using standards, and AMICS software, for automated mineral analysis, are also available.
How does the M4 TORNADO support analysis?
The high versatility of the M4 TORNADO means it brings value to a wide range of different types of analysis. The micro-XRF spectrometer can measure samples of up to 7 kg of mass at high-throughput, with “on-the fly” mapping at rates as low as one millisecond per pixel.
Areas of up to 190 x 160 mm² with the recording of 40 million pixels is possible with data saved as a HyperMap containing the full spectrum for each pixel. The quantification and processing of this data is possible using the XMethod software.
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