Posted in | Physical Properties Testing | Surface Area Analyzers

How to Achieve Optimal 3D Surface Detection?

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The Eagle G5, developed on the popular Eagle product line, is designed to offer unparalleled speed and efficiency.

  • Notably increased throughput
  • New optimized optics
  • Increased resolution for improved detection and metrology
  • Innovative solutions for Multi-RDL, FOWLP, 2.5D, and CMOS Image Sensors
  • Clear-Sight Technology for Multi-Layer RDL
    • Improved detection capability down to 1.4 μm L/S
    • 2× Higher Throughput

Capabilities

  • Inspection of different surface defects at 0.5 μm for Bright Field and 0.3 μm for Dark Field
  • Several magnifications for maximum sensitivity
  • CAD-based detection
  • Allows for the execution of multiple scans with varying focus, magnification, lighting, sensitivity, and detection engines in a single cycle
  • Feature-based classification

Other Equipment by this Supplier

Unlock Precision in Wafer Measurement with MicroProf AP

Unlock Precision in Wafer Measurement with MicroProf AP

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