Nanoscopic “lumps” of atoms, known as clusters, are the specialty of a research team headed by Dieter Fenske from the University of Karlsruhe and the Forschungszentrum Karlsruhe. The production and characteri...
Mobile phones, notebook computers, iPods—the boom in portable computing and communications devices is dependent on rechargeable lithium-ion batteries to deliver power. These batteries offer the highest energy densi...
Bruker AXS Awards $6000 X-ray Diffraction Scholarship at Materials Research Society Fall Meeting in Boston
During the 2007 Materials Research Society Fall Meeting now taking place at the Hynes Convention Center in Bos...
During the 2007 Materials Research Society Fall Meeting now taking place at the Hynes Convention Center in Boston, Bruker AXS, a leading global provider of advanced X-ray solutions for life and advanced materials science...
Chemists from the University of Delaware, in collaboration with a colleague at the University of Wisconsin, have set a new world record for the shortest chemical bond ever recorded between two metals, in this case, two a...
Researchers at the U.S. Department of Energy's Argonne National Laboratory have used a uniquely-constructed perforated diamond cell to investigate oxide glass structures at high pressures in unprecedented detail.
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Intellection again found themselves in the company of winners such as Xstrata, Mincom, Runge and NOJA Power during The Premier of Queensland’s Export Awards 2007, winning the Dermot McManus Award for outstanding ac...
PANalytical, the analytical X-ray company, is celebrating five years of significant growth and development achieved since its launch in September 2002. At that time the business, which was founded in The Netherlands in 1...
Known to the alchemists and long used as a detonator to set off dynamite—mercury fulminate has a checkered past. Now, more than 300 years after the discovery of this explosive compound, German researchers have been...
PANalytical’s X’Pert Reflectivity 1.2 is a new version of the company’s powerful software tool for the analysis of X-ray reflectometry data, important in thin film production and thin film processing re...
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