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NIST Demonstrate Method for Measuring Stress/Strain Levels of Semiconductors at the Nanoscale

NIST Demonstrate Method for Measuring Stress/Strain Levels of Semiconductors at the Nanoscale

BASF Develop New Highly Efficient White Organic Light-Emitting Diode (OLED)

BASF Develop New Highly Efficient White Organic Light-Emitting Diode (OLED)

OSRAM New Automotive LED System Introduced in the New 2010 Ford Mustang

OSRAM New Automotive LED System Introduced in the New 2010 Ford Mustang

Skyray Introduce Latest Addition for its Low-Cost X-Ray Fluorescence Instrument

After 140 Years Helium Compounds Finally Bonds

Siemens Introduce New Laser Scanner Designed for Transfer Carriages

Siemens Introduce New Laser Scanner Designed for Transfer Carriages

New Atomic Scale Motion Picture Marks Breakthrough

New Atomic Scale Motion Picture Marks Breakthrough

Malvern Complete Australian Seminar Series on Laser Diffraction Particle Size Analysis

Malvern Complete Australian Seminar Series on Laser Diffraction Particle Size Analysis

Nanocoatings Overcomes Energy Challenge and Increase Industrial Efficiency

Nanocoatings Overcomes Energy Challenge and Increase Industrial Efficiency

Laser Scanning Microscope from Carl Zeiss Sets New Standard for Confocal Microscopy

Laser Scanning Microscope from Carl Zeiss Sets New Standard for Confocal Microscopy

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