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Particle Characterization Experts to Host Web Seminar

On 18 March 2008, particle characterization experts from Malvern Instruments will host a web seminar highlighting ‘Good practice in using the Sysmex FPIA-3000’. This automated image analysis system is used for wet particle size and shape measurement. The complimentary seminar, scheduled for 10.30am US Eastern Time / 2.30pm UK time will cover routine operation, method development and results analysis, providing guidance and tips for optimizing performance.

To register simply visit http://www.malvern.com/malvern/semmgr.nsf/webseminar?OpenView&site=eng&month=03-2008

The Sysmex FPIA is suitable for the characterization of particles in the size range 0.8 to 300 microns held in suspension or emulsion. It has a unique flow cell design that ensures consistent particle orientation and delivers unrivalled image quality. With short measurement times of around 3 minutes the system is particularly suitable for high throughput applications.

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