Oxford Instruments NanoAnalysis, the world leader in Microanalysis systems announces the launch of AZtec, its next generation materials characterisation system. AZtec is designed to integrate all microanalysis techniques and unleash the potential of the latest detectors. The first release offers EDS and EBSD: users can collect chemical and structural information simultaneously without compromising speed or functionality.
Del Redfern, Marketing Director, commented, "We are very excited about this new system, and it represents a major advance in materials characterisation. It's not just about faster data acquisition, it's ensuring that the results are correct, gaining an in-depth understanding of the sample, and reporting faster than ever."
AZtec is rich in new technologies. It is the first system to fully exploit large area SDD detectors such as the X-Max, and high sensitivity, high speed EBSD detectors, such as the Nordlys. It achieves new levels of accuracy to deliver results that previously could only be achieved by experts; and takes advantage of the latest multi-core computing platforms so all processes, such as acquisition, results interpretation and reporting can occur in parallel.
Building on 40 years experience, AZtec incorporates feedback from the world's largest user community and presents fresh ways of working and displaying results. Users have the option to spread their work over multiple high resolution displays, and can even embed their own Standard Operating Procedures for every stage of the process to ensure conformity.
Oxford Instruments NanoAnalysis Managing Director, Dr. Ian Barkshire, stated, "As a business, Oxford Instruments aims to use innovation to turn smart science into world class products that delight our customers, and AZtec is a classic example of achieving just that!. The enthusiastic feedback I have received from our Voice of the Customer panel and our own worldwide application and support scientists has been overwhelming."
The X-MAX Silicon Drift Detector from Oxford Instruments