Oct 15 2012
In today’s world, digital image capturing for Scanning Electron Microscope (SEM) is a necessity. Clients expect microscopy labs to be able to e-mail their results, include digital SEM images in reports and be able to easily retrieve historical data. Quartz PCI Slow-Scan USB Model adds high quality, digital imaging capture to any analog SEM or STEM, as well as image measurement, processing, annotating and database capabilities.
With Quartz PCI, all SEM controls remain fully operational during image acquisition and the micron marker and other data from the microscope are captured with the image. Quartz PCI matches the image resolution of the microscope’s scan generator and produces captured images that are indistinguishable from photos produced by the microscope. Quartz PCI can also acquire images from two channels simultaneously, such as from secondary and backscatter detectors. Quartz PCI Lab Slow-Scan is compatible with Windows XP, Vista and Windows 7 (32 & 64 bit).
According to Andrew Brown, Founder and President of Quartz Imaging Corp., “Adding Quartz PCI Slow Scan will breathe new life into your SEM, increase productivity and greatly reduce operating costs.”
Quartz PCI Slow Scan software stores images and other data from multiple imaging instruments in a common network database to help with data organization, retrieval and archiving. Data from all instruments can be made available at lab and office computers. It also includes a built-in report generator that can produce reports in PDF, Microsoft Word and Microsoft PowerPoint formats; numerous tools for measuring and annotating images; many image processing and enhancement functions and it supports a large variety of color and gray-scale image file formats.
About Quartz Imaging Corporation
Quartz Imaging has more than 2,000 customers in 37 countries utilizing our industry leading solutions for Digital Image Acquisition and Processing (for most image producing instruments including SEMs, TEMs, STEMs, Tabletop SEMs, Cameras, PC Based Instruments, Scanners); 21 CFR Part 11 Compliance; Laboratory Information Management Systems (LIMS); Failure Analysis Lab Systems (FA-LIMS); Instrument Access Control; Instrument Remote Control; Automated Inspection Systems for Nanotechnology; X-ray Microanalysis (EDX/EDS) Systems and more.