CRAIC Technologies, leading innovator in the field of optical microanalysis, is proud to now offer searchable databases of Raman spectra for use with CRAIC Technology’s Spectral Database Software and the state-of-the-art Apollo™ Raman microspectrometer.
With the largest database containing over eight thousand Raman spectra, spectral data may be searched as well as compared with data acquired with the Apollo™ Raman microspectrometer. Sub-sets of the entire Raman database are also offered and include those targeted specifically for customers working in polymer, semiconductor, forensic, chemistry, pharmaceutical, material science and geological fields.
“CRAIC Technologies has long been a leading innovator in the field of scientific microanalysis. We have helped to advance the field of microscale analysis with innovative instrumentation, software, research and teaching. We have seen the need for Raman microspectroscopy in addition to our current capabilities of UV-visible-NIR and luminescence microspectroscopy. And with the addition of Raman microspectroscopy, our customers needed extensive databases in order to positively identify and study their samples” states Dr. Paul Martin, President of CRAIC Technologies. “CRAIC Technologies is proud to introduce such a large database for use by our customers. The powerful search features as well as the ability to create their own databases with CRAIC’s Spectral Database software greatly enhances the capabilities of the Apollo Raman microspectrometer system.”
The new Raman spectral databases are used in conjunction with CRAIC Technologies Spectra Database Software package. This package provides rapid searching of the databases, up to 5000 compounds per second, as well as advanced comparative and analysis algorithms. This software also features the abilities to create and manage spectral databases in order to grow the basic database library. Designed to operate with CRAIC Technologies Apollo™ Raman microspectrometer, samples may be analyzed and studied rapidly and with precision.