Feb 27 2013
ITOGUMI MOTECH, a joint venture of MOTECH INDUSTRIES INC., a leading solar manufacturer, announced today that it will be exhibiting its PID-resistant modules at PV Expo 2013.
The solar photovoltaic (PV) modules have passed the IEC 62804, 1st edition System Voltage Durability Test for Crystalline Silicon Modules (aka Potential Induced Degradation (PID) resistance test) by Intertek Testing Services. The test measures the sensitivity of the module output parameters when exposed to high voltages temperature and humidity.
Potential Induced Degradation (PID) occurs when modules are exposed to high negative voltage, which affects the modules' electrical performance and efficiency of the entire solar power system. This PID resistant test was conducted by Intertek under stringent environmental conditions of 60 degrees Celsius, 85% relative humidity, and both positive and negative voltage of 1,000 volts for the duration of 96 hours. The results showed that the power degradation of ITOGUMI MOTECH solar modules was lower than 1%, and no changes in visual appearance.
"ITOGUMI MOTECH leverages its manufacturing excellence from Itogumi Construction Co. in Japan and intense testing to enhance the robustness and high quality of modules under the harsh environmental conditions," said Dr. Kuoen Chang, President, ITOGUMI MOTECH. "We are pleased to receive this certificate to reduce performance risks associated with PID and assure our customers of consistent power output."
MOTECH's booth will be in Booth #E49-13, at the PV EXPO 2013 from Feb 27th to March 1st, in Tokyo Big Sight, Japan.