Posted in | News | New Product

New Interlayer Detector for Ion Beam Milling Processes Released by Hiden Analytical

The Ion Beam Milling ion-etching process is vacuum based and is dependent on precise identification of interlayer breakthrough through multiple stacked thin-film layers each of perhaps only a few Angstrom thick.

The Hiden IMP-EPD end point detector system is used routinely for monitoring and control of the total etching process. The system directly monitors the surface ions generated in the etching process, identifying the species present, their relative abundances and precisely defining the interlayer boundary to just 2.5 Angstrom. Species with molecular weights up to 300amu are determined.

The IMP-EPD system is a differentially-pumped ruggedized secondary ion mass spectrometer used in both research and production process environments. Operation is fully automated with user adaptable programs enabling optimisation for the specific user process. Operation with full manual control is provided for the researcher and for service/maintenance functions.

Additionally to end-point analysis the system operates as a highly sensitive  residual gas analyser for measurement of system background gases, and for leak detection with user choice of search gas.

For full details of the system, and of other Hiden surface analysis tools, please contact Hiden Analytical at [email protected] or visit the main website at www.HidenAnalytical.com.

Citations

Please use one of the following formats to cite this article in your essay, paper or report:

  • APA

    Hiden Analytical. (2019, February 08). New Interlayer Detector for Ion Beam Milling Processes Released by Hiden Analytical. AZoM. Retrieved on November 21, 2024 from https://www.azom.com/news.aspx?newsID=41178.

  • MLA

    Hiden Analytical. "New Interlayer Detector for Ion Beam Milling Processes Released by Hiden Analytical". AZoM. 21 November 2024. <https://www.azom.com/news.aspx?newsID=41178>.

  • Chicago

    Hiden Analytical. "New Interlayer Detector for Ion Beam Milling Processes Released by Hiden Analytical". AZoM. https://www.azom.com/news.aspx?newsID=41178. (accessed November 21, 2024).

  • Harvard

    Hiden Analytical. 2019. New Interlayer Detector for Ion Beam Milling Processes Released by Hiden Analytical. AZoM, viewed 21 November 2024, https://www.azom.com/news.aspx?newsID=41178.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this news story?

Leave your feedback
Your comment type
Submit

While we only use edited and approved content for Azthena answers, it may on occasions provide incorrect responses. Please confirm any data provided with the related suppliers or authors. We do not provide medical advice, if you search for medical information you must always consult a medical professional before acting on any information provided.

Your questions, but not your email details will be shared with OpenAI and retained for 30 days in accordance with their privacy principles.

Please do not ask questions that use sensitive or confidential information.

Read the full Terms & Conditions.