New Report on Global e-Beam Wafer Inspection System Market

Research and Markets has announced the addition of the "Global e-Beam Wafer Inspection System Market 2014 Report" to their offering.

E-beam wafer inspection systems are gaining popularity among semiconductor manufacturers because of their accuracy and flexibility. Commenting on the report, an analyst from the researchers' team said: Currently, e-beam wafer inspection systems are being used in wafer inspection processes. It is expected that the systems will also be employed for three-dimensional through-silicon via inspection and extreme ultraviolet mask inspection during the forecast period. Thus, the increasing number of applications for the e-beam wafer inspection systems will tend to increase the customer base, which in turn will increase demand in the market. This is one of the major trends which will influence the growth in the market during the forecast period.

One of the key challenges in this market is the cyclical nature of the semiconductor industry that leads to fluctuations in the demand for e-beam wafer inspection systems. Moreover, in some cases the production of such equipment tends to exceed its demand.

Key Topics Covered

• Executive Summary
• List of Abbreviations
• Scope of the Report
• Market Research Methodology
• Introduction
• Market Landscape
• Geographical Segmentation
• Key Leading Countries
• Buying Criteria
• Market Growth Drivers
• Drivers and their Impact
• Market Challenges
• Impact of Drivers and Challenges
• Market Trends
• Trends and their Impact
• Vendor Landscape
• Key Vendor Analysis

Companies Mentioned

• Applied Materials
• ASML
• Hermes Microvision
• Hitachi High-Tech
• KLA-Tencor
• Lam Research

For more information visit http://www.researchandmarkets.com/research/wv9cxt/global_ebeam