A new Nikon Metrology BW Series WLI microscopy system.
Based on Nikon’s industry-leading, double beam interferometry objectives, Nikon Metrology has launched a series of white light interferometry (WLI) systems, designated BW series, that will set a new standard in 2D and 3D surface profiling.
Graphene layer height measurement using a BW Series microscope. (image courtesy of Dr Peter Blake, Graphene Industries Ltd).
Focus variation with WLI moves the technology forward, with effective height resolution of 15 pm (picometres) and more precise and accurate 3D surface height measurement.
By integrating the new technology into its existing industrial research grade microscopes, the company has been able to combine WLI with standard optical techniques such as bright-field, dark-field, polarised light, DIC (differential interference contrast) and epifluorescence, making the BW series truly versatile imaging systems.
They offer a variety of options including: a choice of high speed and high resolution cameras; a range of Nikon DI objectives; piezo objectives and nosepieces; and manual or motorised scanning stages, all of which allows systems to be tailored to customers’ needs and budgets.
Applications for BW series focus variation WLI microscopes include surface and roughness analysis of glass, ceramic, silicon wafers, ball bearings, image sensors, thin films, graphene, moulds, rubber, metals and plastics.
ABOUT NIKON METROLOGY
Nikon Metrology offers the broadest range of metrology solutions for applications ranging from miniature electronics to the largest aircraft. Nikon Metrology’s innovative measuring and precision instruments contribute to a high performance design-through-manufacturing process that allows manufacturers to deliver premium quality products in a shorter time. Further information is available on www.nikonmetrology.com