May 18 2007
Scientific Solutions has reached an exclusive distribution agreement with JA Woollam Co Inc, USA, manufacturers of Spectroscopic Ellipsometers for non-destructive thin film and bulk material characterization.
Spectroscopic ellipsometry (SE) has become the standard for measuring thin film thickness and optical constants (n and k). Spectroscopic ellipsometry is used for characterization of all types of materials: dielectrics, semiconductors, metals, organics, and more.
Scientific Solutions offers Ellipsometers covering a spectral range to meet any need (from the vacuum UV to the far IR). Many upgrade options are available with our Ellipsometers: automated sample translation, variable temperature (heating or cooling), focusing optics, liquid cells, etc.
The MASE™ is an M-2000® Ellipsometer mounted on an innovative, multi-angle base. MASE™ simplifies multiple angle measurements by using beam steering optics to direct the measurement beam to three angles of incidence while the Ellipsometer remains in a fixed position. This compact design is perfect for large area mapping where the Ellipsometer can "hover" over the sample.
The MASE™ Key Benefits result from proven M-2000® Technology
- Patented RCE Technology (Rotating Compensator Ellipsometer)
- Large spectral range and hundreds of wavelengths
- Short Path length equals a better Signal to Noise Ratio, supported by very fast data acquisition.
- Optional integrated focusing optics, with very simple small spot data acquisition
- Automated sample height adjustment
The MASE's compact design is perfect for large area mapping. The Ellipsometer can "hover" over large samples and still provide superior data at multiple angles. This includes capability for automated tip, tilt, and height adjustment. This all interfaces with WVASE32®, the most comprehensive program available for data acquisition and analysis.