EDAX OIM Analysis Software

EDAX OIM Analysis^TM is the leading microstructural visualization and analysis tool for exploring and interpreting electron backscatter diffraction (EBSD) mapping data. Discover how this powerful tool can characterize challenging materials with just one click by mapping sizable, multidimensional data sets or by using the most extensive analysis portfolio.

In addition to providing unparalelled insight into material properties, OIM Analysis makes EBSD analysis understandable to both inexperienced and seasoned users.

Get a Head Start on Analysis with Quick-Gen

• Answer the most frequently asked questions with a single click by utilizing pre-made templates and analysis tools.

Figure 1. Customized maps showing a) EBSD image quality and IPF orientations, b) PRIAS and grain color maps with twin boundaries, and c) grain size maps after twin removal from a high entropy alloy brazing. Image Credit: AMETEK Gatan, Inc.

• Convert the unique analyses into Quick-Gen templates with a single click for recurring use and to reduce response times.
• Consistently process large, multidimensional datasets or projects using batch processing templates to track microstructural changes across samples, time, or temperature.

Figure 2. Orientation and phase maps showing the transitions between the BCC ferrite phase and the FCC austenite phase during in-situ heating. Image Credit: AMETEK Gatan, Inc.

• Highlight key regions of interest and define partitions to quickly identify and distinguish microstructural changes within your data.

Figure 3. In this partially recrystallized steel sample, the deformed and recrystallized areas can be identified and analyzed individually to better understand recrystallization behavior. Image Credit: AMETEK Gatan, Inc.

All The Tools Needed to Understand the Samples

• Clearly observe deformed microstructures with a resolution of <0.01^o, enhancing orientation precision and minimizing noise in misorientation-based maps.
• Enable every EDAX system to achieve orientation results equal to or better than HR-EBSD, but 100 times faster.

Figure 4. OIM Matrix improves orientation precision and removes noise in the KAM map from an additively manufactured 316L alloy. Image Credit: AMETEK Gatan, Inc.

• To identify important contributors or outliers in the microstructures, use interactive maps and plots to analyze, connect, visualize, and quantify data.
• Measure and quantify directional misorientations in discrete regions of interest with accuracy.
• Use ChI-Scan to concurrently analyze EDS and EBSD data in multiphase samples to remove uncertainty and error.

Figure 5. Phase maps showing how ChI-Scan can use combined EDS and EBSD information to eliminate the ambiguities between similar crystallographic structures and show clear phase maps. Phase map before (left) and after (right) ChI-Scan analysis. The green phase is Kovar (FeNiCo) and the orange phase is copper, both with FCC crystal structures. Image Credit: AMETEK Gatan, Inc.

Unique Solutions to Problems

• Enhance EBSD pattern indexing by combining spherical indexing and NPAR, transforming previously unusable patterns into quantifiable outcomes.
• Make use of the largest toolbox available for analyzing challenging samples using special techniques like spherical indexing, NPAR, and PRIAS.
• Use dynamic diffraction-based pattern simulations to identify the minute variations among comparable crystal structures.
• See more of the sample with PRIAS imaging, which automatically provides topographic contrasts, atomic number, and orientation without the need for extra hardware.

Figure 6. PRIAS maps showing phase, orientation, and topographic contrasts that are not typically observed with standard SEM detectors with EBSD sample geometries. Image Credit: AMETEK Gatan, Inc.