APEXTM EDS is EDAX's premier software tool for gathering and evaluating energy dispersive X-ray spectroscopy (EDS/EDX) data and material compositional characterization. The user-friendly interface, live-time graphical display, and simultaneous review mode analysis of APEX guarantee high-quality, accurate results and enhanced productivity.
Ease of Use
- With profile-based logins, users can make sure that everyone, from individual users to administrators, has the appropriate amount of access
- Easy to use for both inexperienced and seasoned users
- Use a single mouse click to gather and report data
- Automate repetitive processes to facilitate rapid and simple analysis
Customization
- Data windows can be resized and arranged to suit the needs
- Customizable color schemes to align with the scanning electron microscope (SEM) interface or user preferences
- Configurable display options to present data based on user preferences
Features
Simultaneous Live and Review Mode
Enhance experiment efficiency by collecting a spectrum, linescan, or map in real time while analyzing data and generating reports.
Real-Time Results
- Element ID is used to instantly identify and display elements.
- Edit elements dynamically for the most precise and effective analysis.
- Utilize the graphical results and live quantification statistics to quickly comprehend the makeup of the sample.
Graphical representation and statistical analysis of quantification results. Image Credit: AMETEK Gatan, Inc.
Smart Quant
- ZAF-corrected spectral analysis can be used to obtain quantitative compositional data.
- Concurrently conduct quantitative analysis while gathering spectral data without any acquisition delays.
Full Standards Quant
- Adaptability in finding, choosing, and combining standards.
- For accurate quantification results, use the SmartStandards mode to select the best-fitting standards intelligently.
Multipoint Analysis
- To swiftly complete point sampling, use Survey mode.
- To increase the effectiveness of data collection, mark and examine multiple locations on a sample.
- Save and retrieve Multipoint scan lists to streamline and automate data collection and analysis
Data Management and Reporting
- Project tree storage for efficient data management
- One-click saving of windows as *.bmp, *.jpg, *.png, or *.tif images
- Export projects in *.hdf file format
Advanced Reporting
- Reduce the time it takes to get results by directly generating reports from the APEX Live mode.
- To alter presentation templates for pictures, spectra, quantification results, text, logos, and sample data, use Report Designer.
- In a single report, compare data from several areas or samples with ease.
- Combines several templates to make results display simple.
- Create reports automatically as soon as data collection is completed.
EDS Mapping
CompoMap shows separated P K and Zr L overlapping peaks. Image Credit: AMETEK Gatan, Inc.
- Counts per second (CPS) map that illustrates variations brought on by surface features and provides a CPS distribution by displaying count rate quality at each pixel.
- CompoMaps provide more accurate representations of EDS maps by separating contributions from overlapping peaks to individual elemental maps.
- Activate and add elements quickly during mapping to make operation and inspection easier.
- During elemental mapping, choose from 40 color options to easily create vibrant images.
- Map several element lines (K, L, and M) at once.
Dynamic Element Mapping
Dynamic Element Mapping window. Image Credit: AMETEK Gatan, Inc.
- Interact in real-time to display only selected elements in Mapping and Linescan modes.
- During map collection, modify user-selected regions of interest, element lines, and elements.
Montage Large Area Mapping
- Use stage movements to gather data from several areas of analysis.
- Assemble data automatically into a single file for thorough examination.
Smart Phase Mapping
Smart Phase Mapping. Image Credit: AMETEK Gatan, Inc.
- No user setup is necessary.
- Gather spectra, elemental, and phase maps automatically
- Change the phases' names and color schemes.
- Use spectra to predefine or reanalyze phases.
Dual Detectors
- Reduces topographic artifacts and shadowing
- Combining the spectra and compositional maps from both detectors is an option.
- Maintains the energy resolution of a single detector while doubling the throughput count rate.
- Superior stability and resolution compared to systems using a single detector and a large sensor
- Builds more accurate results by averaging quantitative analysis from two detectors.
Enhanced Linescan Acquisition
Advanced Linescan function. Image Credit: AMETEK Gatan, Inc.
- Set up the collection of spectra for effective compositional gradient analysis.
- The Linescan chart's real-time overlay and scaling make it simple to correlate compositional information with image characteristics.
- Prevent sample errors by utilizing Linescan with drift correction in the APEX Advanced software package.
Live Drift Correction
Drift Correction view panel. Image Credit: AMETEK Gatan, Inc.
- Drift parameters are automatically set for convenience.
- For reliable correction performance, the correction frequency is dynamically changed according to the drift magnitude.
- Advanced correction options allow saving drift images and defining a manual reference area.
- Available in Spectrum, Linescan, and Mapping modes to ensure high-quality data across all collection modes.
Spectrum Match
- Make use of the optional feature that lets users look up related spectra in a spectrum library.
- Reduce the difficulty of identifying differences and similarities between spectra and make it easier to identify unknowns by comparing them to possible candidates.
- Create and customize spectrum library for use with Spectrum Match
- Use the Smart Materials and Minerals Library option to compare a gathered "unknown" spectrum to a collection of reference spectra