The HF5000 transmission electron microscope from Hitachi is a 200 kV aberration-corrected CFE TEM or STEM that provides a robust combination of atomic-resolution imaging and analysis, along with extensive automation and sophisticated in-situ capabilities.
Imaging Performance
- With the fully automated Cs corrector, any kind of user can obtain quality results; alternatively, users can take complete manual control whenever they like
- The power of atomic resolution SE imaging can be concurrently used with HAADF/ADF/BF
- Field-free imaging of magnetic specimens in TEM and STEM mode
- Ptychography and 4D STEM can be used to get the most out of samples
Image Credit: Hitachi High-Tech Europe
Analytical Performance
- The high brightness and narrow energy CFE gun ensures optimal EELS performance
- High throughput, high sensitivity EDX with symmetrically opposed dual SDDs offers a collection angle of more than 2 sr
Image Credit: Hitachi High-Tech Europe
Powerful Automation
- With the help of the Azorus open-source software, multi-platform control systems and datasets can be brought together into a single timeline
- Users can program their recipes and workflows in Python for regular tasks, tomography high speed acquisition, or the most complicated in-situ experiments
Advanced In-Situ Capabilities
- In-situ and operando experiments can be performed with gas, liquid, biasing, heating and electrochemistry holders
- Customized holder design service allows users to undertake the required experiment
- The SE detector helps observe in-situ reactions of gases with surfaces
Image Credit: Hitachi High-Tech Europe