The Alemnis nanoindenter module (ASA) is an optional accessory for the atomic force microscope (AFM) LiteScope, designed for incorporation with scanning electron microscopes.
Image Credit: Alemnis AG
The combination of three complementing methods allows micromechanical tests to be carried out while seeing the specimen with outstanding SEM magnification and analyzing the indented specimen with sub-nanometer precision using LiteScope. This one-of-a-kind system is intended for maximum adaptability, allowing for a wide range of creative and complicated applications.
Image Credit: Alemnis AG
Added Values
- Quantitative analysis of mechanical properties (hardness, Young’s modulus, activation volume)
- Accurate analysis of indent topography and roughness of pre-indented samples
- Use of SEM and AFM analyses for effective nanoindentation spot selection
3 in 1: Nanoindentation in correlative AFM-in-SEM measurements webinar by NenoVision & Alemnis
Video Credit: Alemnis AG