CSInstruments' Galaxy Dual Controller reinvigorates existing atomic force microscopy (AFM) systems, turning AFMs like the MultiMode, 5100, and 5500, into cutting-edge instruments for advanced research. Whether the work in semiconductor research, materials science, or nanotechnology, the Galaxy Dual Controller boosts functionality and performance to maximize the potential of the AFM.
Download the Brochure for More Information
Unlock New Possibilities with Advanced Scanning Modes
The Galaxy Dual Controller not only supports standard AFM modes such as STM, Contact, AC, Phase, MFM/EFM/PFM/LFM, and EC but also gives users the option to enhance the system with more sophisticated, specialized scanning modes that offer deeper insights into material properties:
- High-Definition Kelvin Probe Force Microscopy (HD-KFM): Offers crucial insights into electrical properties by precisely measuring surface potential at the nanoscale
- ResiScope: Enables high-resolution mapping of electrical resistance, beneficial for examining the conductivity of different materials with outstanding sensitivity
- Soft-ResiScope: A ResiScope variant that allows for soft-touch measurements; perfect for samples delicate or fragile in nature
- Soft Intermittent Contact Mode: Ideal for soft and sensitive materials and improves imaging capabilities by reducing sample damage during imaging
By improving measurement sensitivity, resolution, and precision, these modes enable researchers to conduct more thorough analyses on a range of sample types.
Seamless Integration with Popular AFM Systems
The seamless integration of the Galaxy Dual Controller with popular AFM systems, such as the MultiMode, 5100, and 5500 AFMs, ensures a smooth upgrade process. It increases the AFM's capabilities so users can take advantage of state-of-the-art advancements while still using familiar equipment.
Key Features
- Compatible with many of the classic AFM modes, including STM, Contact, AC, Phase, MFM, EFM, PFM, LFM, and EC
- Advanced Imaging Modes: HD-KFM, ResiScope, Soft-ResiScope, and Soft Intermittent Contact modes to enhance functionality
- User-Friendly Interface: The software provides automated and manual modes for all user levels, ensuring efficient and high-quality image acquisition
Specifications
- High-Resolution Control: Outstanding precision via 24-bit drive architecture and ultra-low-noise electronics
- Integrated Lock-In: Operates up to 6 MHz, allowing for complex and advanced measurement capabilities
- USB Interface: Simple plug-and-play connectivity
Download the Brochure for More Information
Upgrade the AFM
The Galaxy Dual Controller unlocks the AFM's full potential, bringing unrivaled performance, adaptability, and ease of use to research. By integrating advanced modes and improved control, the Galaxy Dual Controller upgrades the current AFM to a cutting-edge system capable of delivering high-resolution results in a wide range of applications.
Customer Feedback: Revolutionizing Research with the Galaxy Dual Controller
At the Institute of Advanced Energy at Kyoto University, our research focuses on cutting-edge carbon-based functional materials, particularly graphene nanoribbons (GNRs). These GNRs have shown remarkable catalytic performance in the chemical etching of Si, indicating their potential in semiconductor technology. Recently, we upgraded our MultiMode AFM with CSI’s Galaxy Dual Controller.
Hiroshi Sakaguchi, Professor, Institute of Advanced Energy, Kyoto University
“This upgrade has breathed new life into our existing system, significantly expanding its functionality and capabilities. The option to integrate advanced modes, such as; HD-KFM, ResiScope, Soft-ResiScope, Soft Intermittent Contact Mode has notably improved our measurement precision and versatility. We now have the ability to characterize material properties with greater sensitivity, resolution, and accuracy across a wide range of samples," added Sakaguchi.
Image Credit: CSInstruments
Download the Brochure for More Information
Tapping Mode AFM Images of Graphene Nanoribbons on Si
High-resolution Tapping Mode AFM images of graphene nanoribbons on a silicon substrate captured by the upgraded system.
Here are two images taken at various sizes:
1) Large-Scale Image: This image shows a graphene nanoribbon island and offers an overview of the sample's surface structure and distribution on the silicon substrate.
Image Credit: CSInstruments
2) Zoomed-In Image: A closer look at the fine characteristics of the graphene nanoribbons, showcasing the nanoscale characteristics and how they interact with the silicon surface.
Image Credit: CSInstruments
These images demonstrate the clarity and precision obtained with the Galaxy Dual Controller alongside the MultiMode AFM, offering innovative insights into graphene nanoribbons' structural properties.
Sakaguchi further added, “The initial results from our upgraded AFM have been very promising. The Galaxy Dual Controller has already made a substantial impact on our research processes, and we look forward to exploring its full potential. CSI’s support throughout this upgrade has been outstanding, showcasing their commitment to advancing AFM technology. We are excited about the future possibilities with the Galaxy Dual Controller and its role in continuing to enhance our research efforts.”