The Nano-Observer II is a state-of-the-art Atomic Force Microscope (AFM) that blends remarkable performance, adaptability, and ease of use. It offers a range of capabilities for nanoscale imaging and characterization and is intended for both novice and expert users.
Nano-Observer II: Revolutionizing Nanoscale Research with Advanced AFM Technology
Video Credit: CSInstruments
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Key Features
AutoScan Software: Easier and Faster Automated Scanning
- Three clicks produces high-quality images
- Electronic control and automated setup for more straightforward operation
- Advanced users benefit from comprehensive functions and parameter settings
User-Friendly Design
- Small AFM head with a system of pre-positioned tips
- Simple optical path and sample access
- The tip/sample area’s top and side views for an effective pre-approach procedure
Advanced Technology Integration
- 24-bit low-noise USB controller
- Low noise integrated lock-in features that improve phase detection, EFM/MFM/KFM, or PFM
- Advanced imaging modes include HD-KFM, ResiScope, and Soft Intermittent Contact (Soft-IC)
High-Performance Scanning
- Low-noise, high-resolution scanning capabilities
- Large-small area scans without changing the scan head
- Consistent resolution across all scan sizes
Advanced Modes
ResiScope™ III
Sample: Polymer battery. Mode: Soft ResiScope. Scan size: 60 microns Signal: Current from 2 pA to 3 µA. Image Credit: CSInstruments
- Electrical resistance is measured across ten orders of magnitude (102 to 1012 ohms)
- High sensitivity for in-depth examination of the electrical characteristics of materials
- Applications in advanced materials science, semiconductors, and photovoltaics
HD-KFM™ III (High Definition Kelvin Force Microscopy)
Sample: Graphene. Mode: HD-KFM .Scan size: 20 microns. Image Credit: CSInstruments
Sample: Metallic structure embedded on epoxy. Mode: 1. Topography 2. HD-KFM dC/dZ Scan size. Image Credit: CSInstruments
- Creates new benchmarks for mapping surface potential
- Improved spatial resolution and sensitivity
- Ideal for 2D materials, semiconductors, and polymers
Soft IC Mode - The 3rd AFM Mode
- Blends dynamic potential of resonant modes with the accuracy of contact AFM
- Ideal for delicate and soft materials
- Detailed mechanical and electrical measurements with minimal sample disturbance
- Includes Soft Meka, Soft PFM, Soft ResiScope and Soft SThM
Soft MEKA
- Soft IC mode extension for accurate mechanical property measurements
- High-resolution mapping of stiffness and adhesion
- Particularly useful for soft or fragile samples
Soft PFM
- Integrates Piezoresponse Force Microscopy (PFM) with Soft IC
- Simultaneous mechanical and electrical measurements
- Perfect for thorough material analysis with little effect on the sample
Soft SThM Mode
- Soft IC mode extension for accurate thermal property measurements
Application Fields
- Photovoltaics
- Electrochemistry
- Corrosion Studies
- Nanomechanical Analysis
- Materials Science
- Semiconductor Research
- Polymer Studies
- Biological Samples
- 2D Materials Characterization
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