Santec’s Swept Test System was created to streamline photonic testing by providing a full solution emphasizing high-speed analysis, high resolution, and accuracy. The Swept Test System, which combines one of Santec’s tunable lasers (TSL-775 or TSL-570) with an optical power meter (MPM-220), polarization control units (PCU-110), and unique software, optimizes WDL and PDL measurement for usage in both R&D and production scenarios.
Using real-time reference and simultaneously obtaining output power from the tunable laser and transmitted optical power through the DUT, the system achieves excellent precision in WDL and PDL analysis using the Mueller Matrix Method. Over-sampling and rescaling methods are used to increase testing throughput while preserving measurement accuracy.
Key Features
- High resolution at wavelengths below 0.1 pm
- Wide dynamic range (>80 dB)
- Available wavelengths vary from 1240 to 1680 nm
- Multi-channel measurement available
- Fast Sweep Speed (up to 200 nm/s)
Applications
- Optical characterization of components and modules
- Tunable Filters, Interleavers, Fiber Bragg Gratings, Couplers, Splitters, Isolators, Switches, etc.
- WSS and Wavelength Blockers, DWDM components
- Characterization of silicon photonic materials, including microcavity ring resonators
- Interferometry
- Spectroscopy