LayTec AG, leading manufacturer of in-situ metrology for MOCVD processes, announces that it has acquired the majority of tangible and intangible assets of Optical Reference Systems Ltd (ORS). ORS Ltd, former competitor of LayTec.
Optical Reference Systems entered liquidation in August 2011 after an extended period of difficult trading conditions.
Thomas Zettler, CEO & president of LayTec, stated: "The R&D team of ORS did a great job du¬ring the last 3 years in developing complementary metrology technologies. These technologies now will be integrated into LayTec's EpiCurve TT and EpiTT product families. Specifically, com¬bining the full range of in-situ technologies with our brand new software platform EpiNet2.0 will enable all our industry customers to meet the current challenges of yield enhancement and LED performance improvements for solid-state lighting related manufacturing."
Neil Gerrard, former MD of ORS and now president of LayTec UK Ltd, adds: "The R&D team is very happy to have joined forces with the LayTec organization in Berlin. We have been welcomed as partners into this excellent organization supplying both, global industry and academia, with cutting edge integrated metrology products."
About Laytec
LayTec is a major provider of in-situ optical metrology systems for thin-film processes
LayTec sensors are used in a broad range of thin-film applications such as compound semiconductors, photovoltaic, oxide and organic deposition. Advanced use of measurement techniques such as reflectometry, emissivity corrected pyrometry, laser deflectometry, reflectance anisotropy spectroscopy are uniquely combined to create our series of novel products. LayTec's in-situ metrology provides access to all key thin-film parameters in real-time - either during the deposition process or in-line.