Avago Selects Advantest's V93000 Smart Scale Platform for Testing Optical Transceiver Devices

Leading semiconductor test equipment supplier Advantest Corporation has entered a new market segment by selling a V93000 Smart Scale™ platform to Avago Technologies' Fiber Optic Products Division (FOPD) for use in testing optical transceiver devices for high-speed backplane and telecommunication applications.

Advantest's V93000 Smart Scale platform selected by Avago for use in testing optical transceiver devices for high-speed backplane and telecommunication applications.

"Winning this business shows that Advantest can provide highly productive and cost-effective test solutions for applications beyond mainstream semiconductor production," said Makoto Nakahara, senior vice president of sales for Advantest Corporation.

"With the V93000 Smart Scale solution, we get all the features of a fully integrated SoC (system-on-chip) tester along with scalability at a price that is comparable with our previous solution," said Faouzi Chaahoub, senior director of FOPD for Avago. "Additionally, we have been able to achieve four times the level of multi-site testing. We plan to move most of our high-volume production to the V93000 Smart Scale platform."

The V93000 Smart Scale platform meets Avago's requirements for a system that provides a compact footprint, flexible performance and advanced features including digital channel pins for DC testing. The scalable tester purchased by Avago FOPD is equipped with an A-Class test head, two Pin Scale 1600 digital channel cards and a VI32 card, presenting a highly parallel, 16-site wafer-sort solution for the 28 nm technology node and beyond. The system's universal per-pin architecture offers advanced capabilities to deliver customized solutions that reduce the cost of test.

By achieving unprecedented DC accuracy, Advantest's Pin Scale 1600 card addresses the new challenges of testing 28 nm semiconductors that operate at much lower supply-voltage levels. The digital channel card improves parallel-test efficiency by using per-pin features such as on-the-fly pattern changes, clock-domain-per-pin™, protocol-engine-per-pin™, PRBS-per-pin and SmartLoop™. Advantest's DC Scale VI32 card, scalable from 16 to 32 channels, has the flexibility to handle multiple applications while providing precise voltages and supporting multiple power domains.

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