EDAX APEX Software for EBSD

EDAX APEX^TM EBSD provides a user-friendly software platform for analyzing and characterizing electron backscatter diffraction (EBSD) patterns. Rapid, simple, and reliable collection and reporting of high-quality data is made possible by combining robust pattern analysis with an intuitive user interface. APEX provides the best solution for microstructural characterization and boosts user productivity when paired with EDAX hardware.

Ease of Use

APEX EBSD ribbon bar. Image Credit: AMETEK Gatan, Inc.

• Easy to use for both inexperienced and seasoned users
• A graphical ribbon bar makes features and functions easily accessible.
• Analysis modes are grouped into application tabs, and each tab contains logical groups of pertinent functions.
• Data collection parameters and the EBSD detector are automatically optimized..

Adjustable Layouts

• Color schemes that can be chosen to fit user preferences or the interface of a scanning electron microscope (SEM)
• Each application tab has a variety of layouts that display the appropriate view windows for the desired operation.
• The ability to rearrange and resize data view windows to suit user needs
• Conserve and utilize personalized layouts

Context sensitive layout selection. Image Credit: AMETEK Gatan, Inc

User Customization

• Option to use Windows^® Authentication for login
• Single or multi-user modes
• Individual settings saved for each user

Features and Benefits

Triplet Indexing resolves overlapping patterns for better indexing. Image Credit: AMETEK Gatan, Inc.

Triplet Indexing Engine

• Use the special three-bands (triplets) indexing technique to reduce sensitivity to rogue band detection.
• Achieve high indexing success rates with Triplet Indexing, even at the maximum speeds of Velocity^TM EBSD detectors.
• The value of the Confidence Index offers a numerical assessment of the crystallographic indexing solution's quality.
• To ensure that all crystal structures can be successfully indexed, adjust the band detection parameters on the specific Hough page.
• Generate excellent indexing results for real-world samples.

Comprehensive EBSD Data Collection

• Gather individual EBSD patterns or a complete scan with ease.
• There are various scan modes available.
• Enhanced data sampling using hexagonal grid sampling
• Acquisition of line scans
• Automatically recommends optimal step sizes for efficient scanning
• Application-specific EBSD data collection using automatic detector optimization

Multiple scanning modes available. Image Credit: AMETEK Gatan, Inc.

Dynamic Scanning

• During each scan, monitor and evaluate data collection in real-time with both visual and numerical feedback.
• Image quality, SEM signal, and optional PRIAS are all included in grayscale maps.
• IPF, Confidence Index, phase, and energy dispersive spectroscopy (EDS) components are all included in color maps.
• To better understand the results, combine color and grayscale maps.
• Summary of data statistics, EBSD pattern, and indexing display
• Display of Crystal Unit Cells
• Hough band identification
• Feedback informs users about the quality of the collection.

Montage Large Area Mapping

EBSD mapping example from a high entropy alloy weld. Image Credit: AMETEK Gatan, Inc.

• Use stage movements to gather data from several areas of analysis.
• Assemble data automatically into a single file for thorough examination.
• Available oversampling to enhance field matching

Batch Scanning

• Enable efficient use of SEM for analyzing multiple areas or samples
• Collect a series of scans as a single batch process
• Define standard free-form, Montage, and line scans within a batch
• Define the magnification, scan area, step size, simultaneous EDS, and stage location within the batch

Data Management

Project Tree Data Organization. Image Credit: AMETEK Gatan, Inc.

• Project tree structure for seamless data organization
• 64-bit software architecture for efficient big data processing
• HDF file format for enhanced data management and portability
• Single file storage for both EDS and EBSD data collection
• Customizable file naming and location to meet user requirements
• Default names within the project tree for quick collection with the option to rename if desired
• HDF file compatible with APEX Review for EDS analysis and OIM Analysis^TM for EBSD analysis

Integrated EDS-EBSD

• Simultaneous EDS-EBSD scanning compatible with ChI-Scan processing for enhanced multi-phase analysis
• Full integration of EDS and EBSD for comprehensive materials characterization
• Utilize advanced EDS quant engine optimized for high-tilt EBSD geometries
• Combine EDS spectrum with EBSD pattern collection for correlation of chemical and structural information

Advanced Reporting

• Use reporting with batch scanning capability
• Generate reports from APEX EBSD or from OIM Analysis software
• Customizable report generation based on OIM Analysis user templates
• Tailored report layout with the Report Designer tool
• User-defined report content in template files with default design templates available