EDAX OIM Matrix

Electron backscatter diffraction (EBSD) analysis is enhanced by EDAX OIM Matrix^TM software, which enables users to model patterns derived from the dynamics of electron diffraction. This optional EDAX OIM Analysis^TM module generates more realistic pattern simulations and accurate descriptions of electron interaction behaviors within a sample than conventional kinematic diffraction-based methods.

Indexing performance and orientation precision can be enhanced by more easily and precisely comparing these simulated patterns with EBSD patterns that have been collected experimentally.

Figure 1. Schematic of spherical indexing procedure where experimental EBSD patterns are projected onto a sphere to match against a simulated master pattern to improve indexing performance. Image Credit: AMETEK Gatan, Inc.

Spherical Indexing

Figure 2. Comparison of spherical indexing performance with traditional Hough-based indexing and NPAR approaches on a deformed aluminum alloy. The indexing success rates (shown in parentheses) are maximized by combining spherical indexing and NPAR together to analyze as much of the field of view as possible. Image Credit: AMETEK Gatan, Inc.

Figure 3. Dynamically simulated EBSD patterns for: a) Cr₂₃C₆, b) TiN, and c) Sigma phases using OIM Matrix. Source: AMETEK Gatan, Inc.

The advanced EDAX spherical indexing* technique delivers superior results by indexing experimentally acquired EBSD patterns with master pattern simulations.

• Compatible with Transmission Kikuchi Diffraction (TKD) for enhanced spatial resolution
• Outperforms traditional Hough-based indexing with improved accuracy
• Speeds up reindexing to over 10,000 pps
• Enhanced EBSD pattern signal-to-noise ratio when combined with NPAR^TM
• Seamless integration with OIM Analysis for easy access to spherical indexing functionality
*Requires NVIDIA GPU card running drivers 452.39 or newer (support CUDA runtime version 11.7 or newer)

Realistic EBSD Pattern Simulations

Figure 4. Spherical indexing improvements on a shot-peened titanium alloy. The increased colored orientation measurements and reduction of black non-indexed points with spherical indexing compared to traditional indexing shows where orientations can now be reliably measured. Image Credit: Mr. Prathompoom Newyawong, NSTDA Characterization and Testing Service Center.

• Access to over 280 pre-calculated master patterns for immediate simulations
• Simulates additional crystals using crystal structure and atomic position data
• Utilizes dynamic diffraction effects and forward modeling for precise prediction of scattering and diffraction intensities in EBSD patterns
• Effortlessly compares experimental patterns with dynamic simulations for improved analysis

Dictionary Indexing

Performance is better with template matching than with conventional Hough-based indexing.

Orientation Refinement

• Eliminates pseudosymmetry indexing artifacts for more accurate results
• Enhances orientation precision for detailed characterization of deformed materials
• Achieves precision levels of <0.01^o resolution for superior analysis

Automatic Structure File Optimization

Figure 5. Improved indexing and grain determination in the NMC Li-ion battery cathode material. The speckling within grains with traditional indexing is eliminated with spherical indexing. Image Credit: Dr. Siyan Wang, Imperial College London

• Simplifies the analysis of new materials for faster insights
• Automatically generates and optimizes the reflector list for traditional Triplet Indexing