AFM Raman Systems

AFM/Raman is a synergistic tool that can simultaneously determine a sample’s topography (atomic force microscopy) and chemical signature (Raman spectrum). In atomic force microscopy, a small, sharp probe is used to discover the electrical current, surface potential topography, hardness, adhesion, thermal conductivity, temperature electrochemistry and/or other particular nanomechanical properties. AFM can also be used to produce three-dimensional models of sample properties. Raman spectroscopy determines chemical composition by measuring the molecular vibrations, rotations or other excitations of a sample. It is the preferred technique for direct, non-destructive investigation of chemical sample. The end result of combining the two techniques is a more thorough sample characterization in one handy instrument that provides fast simultaneous co-localized measurements.