Equipment | Physical Properties Testing |Wafer Mapping Systems

Wafer Mapping Systems

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As one of the most popular tools used today to analyze data in the semiconductor manufacturing process, wafer-mapping software is capable of calculating reasons of yield loss, as well as identify the efficiency of operational functionality that can affect the semiconductor device yield. Wafer mapping, or substrate mapping, is a process in which the performance of semiconductor devices on the surface of a substrate is visualized through the production of a color-coded grid. The values represented on the color-coded grid are then used to analyze any possible causes of deviations that can directly impact semiconductor wafer yield, allowing for this diagnosis to lead to improvements in production processes.

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