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Dimensional Stability Offered By Two Component Urethane Modified Epoxy Gel

Dimensional Stability Offered By Two Component Urethane Modified Epoxy Gel

Thin Film Applications For Fully Integrated Benchtop Ellipsometer

Thin Film Applications For Fully Integrated Benchtop Ellipsometer

Renishaw inVia Raman Microscope Helping Develop Large Defect-free Films of Graphene

Agilent Technologies Introduces Essential Chromatography and Spectroscopy Catalog 2013

Agilent Technologies Introduces Essential Chromatography and Spectroscopy Catalog 2013

A New Generation of Turnkey TCSPC Fluorescence Lifetime Systems From HORIBA Scientific

INEL and IUT Organize Workshop on Combined Analysis Using X-ray and Neutron Scattering

INEL and IUT Organize Workshop on Combined Analysis Using X-ray and Neutron Scattering

Novel Method to Analyze Protein Structures

Novel Method to Analyze Protein Structures

Quartz Imaging Introduces ON-X Take Off Angle Detector for XOne X-Ray Microanalysis System

Quartz Imaging Introduces ON-X Take Off Angle Detector for XOne X-Ray Microanalysis System

CRAIC Technologies Announce Raman Spectral Surface Mapping Capability for Apollo Microspectrometers

CRAIC Technologies Announce Raman Spectral Surface Mapping Capability for Apollo Microspectrometers

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