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New Brochure Outlines Features of the Hiden SIMS/SNMS Workstation

New Brochure Outlines Features of the Hiden SIMS/SNMS Workstation

LayTec Launches EpiCurveTT AR for Measuring Aspherical Curvature During Epitaxial Growth

LayTec Launches EpiCurveTT AR for Measuring Aspherical Curvature During Epitaxial Growth

LayTec Install EpiCurve TT System at Fraunhofer Institute for Applied Solid State Physics

LayTec Install EpiCurve TT System at Fraunhofer Institute for Applied Solid State Physics

Elliot Scientific Now Offering CRAIC Technologies 308 PV UV-visible-NIR Spectrophotometer

Materials Characterization Company Malvern Receives 2010 Queen's Award for Enterprise in Innovation

Materials Characterization Company Malvern Receives 2010 Queen's Award for Enterprise in Innovation

NDC Infrared Engineering Ltd Launch New Thickness Measurement Gauges at K2010

NDC Infrared Engineering Ltd Launch New Thickness Measurement Gauges at K2010

SPECTRO to Show Latest ICP-OES at Tradeshow in Japan

SPECTRO to Show Latest ICP-OES at Tradeshow in Japan

Craic Release New UV-Visible-NIR Spectrophotometer for Your Microscope

Craic Release New UV-Visible-NIR Spectrophotometer for Your Microscope

Penn State University Win Micromeritics Surface Area and Porosimetry Analyzer

Penn State University Win Micromeritics Surface Area and Porosimetry Analyzer

New Method for Studying Biological Characterization of Nanomaterials

New Method for Studying Biological Characterization of Nanomaterials

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