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WITec Extends alpha300 Microscope Range to Suit Customer Requirements

Malvern Experts Demonstrate How Dynamic Particle Image Analysis for Sub-Visible Particulates

Malvern Experts Demonstrate How Dynamic Particle Image Analysis for Sub-Visible Particulates

Check Out Micromeritics Latest Particle Characterization Equipment at Analytica

Check Out Micromeritics Latest Particle Characterization Equipment at Analytica

MICROSCIENCE 2010 to Receive Increased Support and Host European Society's General Assembly

New Band Excitation Technique Results in 8 New Grants for SPM and AFM Users

Quick and Easy Semi Quantitative Atomic Absorption Measurements Possible with ContrAA

Graphene TEM Support Films Available from Electron Microscopy Sciences

Micromeritics Release New Isotherm Data for Characterizing Porous Carbons

Veeco Introduce the Dimension Edge AFM System

Veeco Introduce the Dimension Edge AFM System

Princeton Instruments Introduce New Software Package for Spectroscopy and Scientific Imaging Applications

Princeton Instruments Introduce New Software Package for Spectroscopy and Scientific Imaging Applications

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