Coupling experience with performance, the Rigaku Simultix simultaneous Wavelength Dispersive X-Ray Fluorescence (WDXRF) is an elemental analytical tool widely-used in industries requiring high throughput and precision, including the steel and cement industry. For the last 40 years, nearly 1,000 Simultix XRF systems have been delivered to customers all over the world; with Rigaku continuously implementing significant changes to the device to increase performance and meet customer needs.
Offering improved functionality and usability, the Simultix 15 is a compact yet powerful analytical tool that boasts of superior performance in a wide array of industrial sectors.
Fast and Precise Elemental Analysis
In analyzing beryllium (Be) through uranium (U) in almost any sample matrix, a user would realize that the most important metrics for automated process control are accuracy, precision, and throughput.
Featuring up to 30 discrete and optimized elemental channels as well as 4 kW of X-ray tube power, Simultix 15 promises to perform reliably with the previously mentioned qualities of correctness etc. required from an efficient X-ray fluorescence device.
Coupling the device with Rigaku’s powerful and easy-to-use software would enable unparalleled analytical speed and sensitivity for metrology, especially in extensive data reduction and maintenance.
Full Automation Elemental Analysis
Automation is a fundamental requirement for high throughput applications. Following this standard, the Simultix 15 WDXRF spectrometer may be fitted with a 48-position Automatic Sample Changer (ASC). The full automation feature, coupled with an optional sample loading unit, provides right or left side belt-in feed from a third-party sample preparation automation system.
Elemental Analysis by Simultaneous WDXRF
Compared to the more common sequential WDXRF instrumentation, where elements are measured one after another through a scanning goniometer, coupled with an analyzing crystal changer mechanism, simultaneous WDXRF speeds up the measurement process.
This functionality is enabled by each Simultix 15 device since it is customizable for specific elemental analysis needs. Using a set of discrete, optimized, fixed channels for various elements, all channels may be measured simultaneously without time delay, moving parts, or compromise.
Because of this, the Simultix 15 WDXRF is the best option to choose when a user is looking for a precise, low-cost, reliable, and lasting product. For added performance, the Simultix 15 Wavelength Dispersive X-Ray Fluorescence spectrometer may be optionally equipped with a scanning goniometer for analysis of other elements and for phase analysis of XRD channels.
Dispersive X-Ray Fluorescence Spectrometer for Simultaneous Wavelengths - Simultix 15
Dispersive X-Ray Fluorescence Spectrometer for Simultaneous Wavelengths - Simultix 15 - Picture 1
Dispersive X-Ray Fluorescence Spectrometer for Simultaneous Wavelengths - Simultix 15 - Picture 2