Semilab’s PDL Hall system is suitable for both AC and DC Hall measurement modes. The AC magnetic field measurement can be performed on materials with a mobility of less than 0.1 cm2/Vs, which can be superior to the DC magnetic field measurement mode.
What Materials Can be Measured Using PDL-1000?
- Thermoelectric materials
- Photovoltaics: aSi, CIGS, perovskite
- Organic electronics: OTFT, OLED
- Transparent conductive oxides (TCO): ITO, AZO, ZnO, IGZO
- Wide bandgap materials
- III-V, II-VI semiconductors and other semiconductor materials
Options:
- Unique CRPH (carrier resolved photo-Hall) measurement for minority carrier mobility
- LN2 cryostat for temperature-dependent measurement

Operation of the Parallel Dipole Line magnets. Image Credit: Oki Gunawan/IBM Research

PDL-1000 setup and sample holder. Image Credit: Semilab Semiconductor Physics Laboratory
High Sensitivity Parallel Dipole Line Hall Measurement With AC/DC Magnetic Field
Key Features:
- Simple and sturdy tabletop system design
- A broad range of mobilities, such as semi-insulating samples and very low mobilities (< 0.1 cm2/Vs), can be measured, including the ability to carry out both conventional static magnetic field (DC) and alternating (AC) Hall measurements
- Tabletop arrangement, using rotating Parallel Dipole Line magnets (bulky electromagnet not required)
- Background illumination option
- Software retrieves a low Hall signal with the help of software-based lock-in detection (this avoids the need for expensive hardware-based lock-in detection)
- Software-regulated measurement and automated parameter extraction
- A cooling system is not required
- Easy operation
- High sensitivity (ability to handle mobility < 0.1 cm2/Vs)
- Uniformity (< 2 %, sample size up to 10 × 10 mm)
- Large magnetic field (approximately 2.5 Tesla pk-pk)
- Proprietary signal processing and user interface (UI) software
- Optional gate bias voltage.
For more information, please visit the supplier webpage or request a quote.

Measurement results. Image Credit: Semilab Semiconductor Physics Laboratory

Screen copy of PDL-1000 measurement sequence. Image Credit: Semilab Semiconductor Physics Laboratory

PDL-1000 with CRPH option. Image Credit: Semilab Semiconductor Physics Laboratory