A Hall Effect Measurement System using AC and DC Fields | PDL-1000

Semilab’s PDL Hall system is suitable for both AC and DC Hall measurement modes. The AC magnetic field measurement can be performed on materials with a mobility of less than 0.1 cm2/Vs, which can be superior to the DC magnetic field measurement mode.

What Materials Can be Measured Using PDL-1000?

  • Thermoelectric materials
  • Photovoltaics: aSi, CIGS, perovskite
  • Organic electronics: OTFT, OLED
  • Transparent conductive oxides (TCO): ITO, AZO, ZnO, IGZO
  • Wide bandgap materials
  • III-V, II-VI semiconductors and other semiconductor materials

Options:

  • Unique CRPH (carrier resolved photo-Hall) measurement for minority carrier mobility
  • LN2 cryostat for temperature-dependent measurement

Operation of the Parallel Dipole Line magnets

Operation of the Parallel Dipole Line magnets. Image Credit: Oki Gunawan/IBM Research

PDL-1000 setup and sample holder

PDL-1000 setup and sample holder. Image Credit: Semilab Semiconductor Physics Laboratory

High Sensitivity Parallel Dipole Line Hall Measurement With AC/DC Magnetic Field

Key Features:

  • Simple and sturdy tabletop system design
  • A broad range of mobilities, such as semi-insulating samples and very low mobilities (< 0.1 cm2/Vs), can be measured, including the ability to carry out both conventional static magnetic field (DC) and alternating (AC) Hall measurements
  • Tabletop arrangement, using rotating Parallel Dipole Line magnets (bulky electromagnet not required)
  • Background illumination option
  • Software retrieves a low Hall signal with the help of software-based lock-in detection (this avoids the need for expensive hardware-based lock-in detection)
  • Software-regulated measurement and automated parameter extraction
  • A cooling system is not required
  • Easy operation
  • High sensitivity (ability to handle mobility < 0.1 cm2/Vs)
  • Uniformity (< 2 %, sample size up to 10 × 10 mm)
  • Large magnetic field (approximately 2.5 Tesla pk-pk)
  • Proprietary signal processing and user interface (UI) software
  • Optional gate bias voltage.

For more information, please visit the supplier webpage or request a quote.

Measurement results

Measurement results. Image Credit: Semilab Semiconductor Physics Laboratory

Screen copy of PDL-1000 measurement sequence

Screen copy of PDL-1000 measurement sequence. Image Credit: Semilab Semiconductor Physics Laboratory

PDL-1000 with CRPH option

PDL-1000 with CRPH option. Image Credit: Semilab Semiconductor Physics Laboratory

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