COXEM has introduced a new scanning transmission electron microscopy (STEM) detector that provides the ability to use either the CX-200plus SEM or the EM-30 Series Tabletop SEM to carry out STEM analysis with conventional TEM grids.
With the help of this optional accessory and COXEM’s 30 kV beam energy, users’ SEM instrument can serve more roles in the laboratory.
The STEM detector can be mounted to the SEM through a side port. When not in use, the STEM detector retracts and tilts to an angle of 90° out of view for standard SEM analysis.
In contrast to other STEM modules in which a platinum mirror is utilized to obtain an image with the SE detector, the STEM module offers a true detector placed below the TEM grid sample. Both Dark Field (DF) and Bright Field (BF) images can be collected by the SEM detector.
In addition to the detector, the STEM Accessory comprises a special TEM grid holder that can be directly mounted to the SEM Stage. Up to four individual TEM grids can be accommodated in the TEM grid holder. Furthermore, the TEM grid holder has been designed to accommodate EDS analysis without any special adjustment or obstruction.
One of the most effective applications of the STEM module is to determine the morphology and size of nanoparticles spread onto TEM grids with Silicon Nitride support films or with carbon support films.
Although it is possible to use the STEM adapter for conventional thin-section tissue analysis, the 30 kV beam energy may need thinner tissue sections than conventional transmission electron microscopes (TEM) with 80–200 kV beam energies.
An Ultra-Microtome is generally required to prepare sufficient tissue samples, but the STEM module with the SEM can still be used for pre-screening samples before basic TEM analysis, TEM analysis, or as a practical teaching tool for TEM analysis.
Specifications of the COXEM STEM Module for SEM
- Retractable detector
- Detector position can be adjusted
- Both Dark Field (DF) and Bright Field (BF) imaging are possible
- X-Y Stage can be used to position any of the four sample locations
- NS 4.0 software includes a dedicated detector image channel
- Sample holder is included for four TEM grids
