This DECTRIS ELA® hybrid-pixel electron detector is fast and sensitive, making it ideal for EELS and 4D STEM data collection.
The DECTRIS ELA electron-counting detector provides best-in-class performance in terms of detector noise, frame rate, and dynamic range. It can withstand probe currents of more than 100 pA and catches weak and strong reflections, allowing for improved diffraction and imaging experiments. Furthermore, it enables rapid elemental mapping, which is essential when working with beam-sensitive materials.
Electron Energy Loss Spectroscopy (EELS) and Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM) are two applications for which the ELA hybrid-pixel detector is specially designed.
The ELA hybrid-pixel detector is specifically designed for applications such as Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM) and Electron Energy Loss Spectroscopy (EELS).
- Captures everything: The ELA detector's dead-time-free readout captures all information available from the sample.
- Fast: The ELA detector’s high frame and count rates substantially shorten experiment time while increasing instrument throughput
- Simple: The ELA detector’s Application Programming Interface (API) allows for easy integration into any current data pipeline or electron microscopy suite
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Detector Specifications
Source: Dectris Ltd
| . |
. |
| Number of pixels (W x H) |
1028 x 512 |
| Active area (W x H) [mm²] |
77.1 x 38.4 |
| Pixel size (W x H) [µm²] |
75 x 75 |
| Sensor material |
Silicon (Si) |
| Energy range [keV] |
30 - 200 |
| Frame rate (max.) [Hz] |
2250 (16-bit); 4500 (8-bit) |
| Frame rate (ROI, max.) [Hz] |
9000 (16-bit); 18,000 (8-bit) |
| Count rate (max.) [el/s/pixel] |
107 |
| Detective Quantum Efficiency, DQE(0) |
0.9 at 100 kV, 0.8 at 200 kV |
| Detector mounting |
On-axis, post spectrometer |
Integrated Solutions
Gatan Stela Camera
This first fully integrated hybrid-pixel electron detector includes Gatan Microscopy Suite® (GMS) software for sophisticated electron diffraction research.
Image Credit: Dectris Ltd
Nion IRIS EEL Spectrometer
With an exceptional energy resolution of 4 meV, this spectrometer has the highest energy resolution available on the market.
Image Credit: Dectris Ltd
CEOS CEFID
CEOS CEFID is ideal for Electron Energy Loss Spectroscopy (EELS) applications due to its low non-isochromaticity (NI), long-term stability, and consistency of optical alignments, which ensures superior energy resolution.
Image Credit: Dectris Ltd
Case Study
In a joint article in Ultramicroscopy, Nion and DECTRIS examined and described the DECTRIS ELA® hybrid-pixel electron detector and its application possibilities.
Publication: Hybrid-pixel Direct Detector for Electron Energy Loss Spectroscopy, Ultramicroscopy Vol. 217, October 2020
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Techniques
Electron Energy Loss Spectroscopy (EELS)
Using the radiation-hard, high-dynamic-range electron detectors, users can capture both the Zero-Loss Peak (ZLP) and the core-loss characteristics in the spectrum simultaneously.
Image Credit: Dectris Ltd
Fast Elemental Mapping
Using the highly fast hybrid-pixel detectors, users can perform elemental mapping almost in real time with minimum radiation damage to the material.
Image Credit: Dectris Ltd
Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM)
Use accurate and dependable electron-counting detectors to collect high-quality 4D STEM data.
Image Credit: Dectris Ltd