Measuring a sample’s precise response to the application of small voltages and currents can provide valuable insights when exploring new materials and devices. However, setting up such a system to sufficiently make — and reliably replicate — such measurements isn’t typically a straightforward process.
This eBook examines an easier approach to instrumenting such low-level measurement setups, one that utilizes techniques afforded by the capabilities of Lake Shore’s M81-SSM synchronous source measure system. It explains how this modular, multichannel system simplifies measurements by reducing the number of separate instruments and cables required while also combining the convenience of DC and AC sourcing with DC and AC measurement, including a lock‑in’s sensitivity and measurement performance.
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In the eBook, we explore how the system’s:
- advanced lock-in and unique differential (balanced) source and measure technologies deal with removing noise from measurements, particularly in low-temperature applications
- finite impulse response (FIR) filtering enhances the speed of lock-in measurements
- sensitivity, noise rejection, and uninterrupted acquisition of data enable you to characterize nanostructures more confidently
- multichannel lock-in acquisition and current autoranging capabilities can be used for external quantum efficiency (EQE) characterization
- balanced current source and voltage measure modules provide differential noise reduction advantages for variable-temperature, four-wire sheet resistance measurements
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