X-Ray Diffractometers

X-ray diffraction utilizes the twin wave-particle nature of X-rays to acquire data on the composition of crystalline materials. When an incident beam of monochromatic x-rays interfaces with a crystalline material, x-rays go through both constructive and destructive interference, collectively known as the process of diffraction, according to Bragg’s Law – with the directions of possible diffractions dependent upon the size and shape of cell units within the material. A principal use of the method is the detection and investigation of compounds according to their x-ray diffraction pattern. X-ray diffractometers are capable of non-destructively evaluating matter in normal atmospheric conditions. Qualitative evaluation of matter, lattice constant resolution, stress rating, and other characteristics can be determined by X-ray diffraction.