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High Volume Inspection for Contour, Roughness and Roundness

High Volume Inspection for Contour, Roughness and Roundness

Lloyd Instruments to Show Latest Materials Testing Machines at K2010

Lloyd Instruments to Show Latest Materials Testing Machines at K2010

New Teaching Resource for High Resolution Continuum Source Atomic Absorption Spectrometry

Scientists Find Solution to Solve Energy Crisis

Scientists Find Solution to Solve Energy Crisis

LOT Oriel Appointed Distributors for KLA Tencor Stylus and Optical Surface Profilers

Struers Become Exclusive Distributor for Phenom Desktop SEMs in Nordic region

Electron Microscopy Sciences Introduces EMS 150R Compact Rotary-Pumped Coating System

Electron Microscopy Sciences Introduces EMS 150R Compact Rotary-Pumped Coating System

Elster Displays New C700 Polymer Meters at AWWA Expo in Chicago

Elster Displays New C700 Polymer Meters at AWWA Expo in Chicago

Enhanced DTEM Produces High-Resolution Images of Catalyst Nanomaterial

NSF to Build One of World's Most Powerful Mass Spectrometers

NSF to Build One of World's Most Powerful Mass Spectrometers

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