CEMMNT partner, Taylor Hobson, launches CCI SunStar, leading the world in the next generation of combined thin film dimensional optical profilers. This instrument merges world-leading non-contact dimensional measurement capabilities with advanced thin and thick film technology.
Malvern Panalytical has launched Malvern Panalytical Link II, a new and powerful OPC-standardized software package that simplifies the integration of analytical devices with expert control systems in manufacturing processes.
Innov-X Systems and Steinert have entered into an OEM agreement to market a new high speed, x-ray fluorescence-based (XRF) sorting system that will effectively identify and remove copper containing material, such as &quo...
Come see Innov-X’s new DELTA Line of handheld XRF analyzers in action at Booth 1421 during this year’s ISRI Convention & Expo. This new rugged, yet sophisticated, DELTA handheld XRF tool produces on the spot elemental analysis, saving recyclers time and instantly earning them money.
Oxford Instruments Magnetic Resonance, a leading supplier of low-field benchtop nuclear magnetic resonance (NMR) technology, with North American operations based in Concord, Massachusetts, announces that it will be showcasing its popular MQC analyzers at the American Oil Chemists Society (AOCS) Annual Meeting.
Until now, the only way to quantify wetting of a material's surface has been to measure the shapes of the droplets that form on it, and this method has very limited resolution. But a team of MIT researchers has found a way to obtain images that improves the resolution of such measurements by a factor of 10,000 or more.
Bruker today announced that it has been awarded a $1.1 million contract to supply a customized N8 TITANOS™ large sample Atomic Force Microscope (AFM) to the United States Commerce Department's National Institute of Standards and Technology (NIST).
FEI Company (Nasdaq:FEIC), a leading diversified scientific instruments company providing electron and ion-beam microscopes and tools for nanoscale applications across many industries, today introduced the new Helios Nan...
Nanometrics Incorporated (Nasdaq: NANO), a leading supplier of advanced process control metrology systems used primarily in the manufacturing and packaging of semiconductors, solar photovoltaics and high-brightness LEDs,...
Modern SDD-based EDXRF is an often overlooked, yet highly versatile, technology tool for primary metal producers, like the steel industry. SPECTRO EDXRF spectrometers offer a degree of analytical flexibility not found in...
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