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New 3D Detector Launched by PANalytical at Pittcon

New 3D Detector Launched by PANalytical at Pittcon

The introduction of PANalytical’s revolutionary PIXcel3D detector at this year’s Pittcon conference and expo (28 February - 5 March 2010, Florida, US), adds a new dimension to X-ray diffraction (XRD).

24 Mar 2010

Free Online Seminar on Failure Analysis from Stork

Free Online Seminar on Failure Analysis from Stork

Stork CRS in Wixom, Michigan, is offering a free online seminar, "Failure Analysis Support and Expert Witnessing for the Legal Profession ." Dr. John Tartaglia, Senior Metallurgical Engineer and Engineering Manager, will be presenting this webinar on Friday, April 16, 2010 at 2:00 p.m. EST.

From Element Materials Technology 23 Mar 2010

Asylum Research are Co-Organizing the International Workshop for SPM for Energy Applications with ORNL

Asylum Research are Co-Organizing the International Workshop for SPM for Energy Applications with ORNL

The Center for Nanophase Materials Sciences at Oak Ridge National Laboratory (ORNL) and Asylum Research, the technology leader in scanning probe/atomic force microscopy (SPM/AFM), are co-organizing the International Workshop for Scanning Probe Microscopy for Energy Applications, to be held at ORNL September 15-17, 2010.

From Vibrantz Technologies 23 Mar 2010

Bruker Launch Ultra-Compact Spark Optical Emission Spectrometer

Bruker Launch Ultra-Compact Spark Optical Emission Spectrometer

Bruker Elemental today announces the launch of the all-new Q2 ION™, an ultra-compact spark optical emission spectrometer (OES) for metals analysis. The Q2 ION is a true multi-matrix system for comprehensive incoming material inspection and quality assurance of metal alloys.

From Bruker Nano Surfaces and Metrology 23 Mar 2010

Zethius and Bruker Collaborate on Zethus Cumulus CyberLab Technology

Zethus Software, a leader in cloud storage technology and a Youngstown Business Incubator Portfolio company announces a worldwide strategic alliance with Bruker AXS. Under the terms of the agreement Bruker will strategic...

From Bruker Nano Surfaces and Metrology 23 Mar 2010

Bruker Introduce New Benchtop EDXRF Spectrometer at Analytica

Bruker Introduce New Benchtop EDXRF Spectrometer at Analytica

At Analytica 2010, Bruker AXS today launches its significantly enhanced S2 RANGER™ energy dispersive X-ray fluorescence (EDXRF) spectrometer with the new, maintenance-free 4th-generation XFlash® LE silicon drift detector (SDD).

From Bruker Nano Surfaces and Metrology 23 Mar 2010

Next Generation D8 Discover XRD System Released at Analytica

Next Generation D8 Discover XRD System Released at Analytica

At Analytica 2010, Bruker AXS, the market leader in X-Ray Diffraction (XRD), introduces its next-generation D8 DISCOVER™ diffraction system for advanced materials research.

From Bruker Nano Surfaces and Metrology 23 Mar 2010

Bruker Unleash A Host of New Products at Analytica

At Analytica 2010, Bruker Corporation (NASDAQ: BRKR) today announces launches of numerous novel scientific instruments and software capabilities, as well as high-performance analytical solutions for applied markets and i...

From Bruker Nano Surfaces and Metrology 23 Mar 2010

New FT-NMR Spectrometer is within Reach of All Chemists

New FT-NMR Spectrometer is within Reach of All Chemists

Bruker BioSpin announces the new Fourier 300, an innovative, easy-to-use 300 MHz high-resolution spectrometer that brings Fourier transform (FT) Nuclear Magnetic Resonance (NMR) spectroscopy within every chemist’s reach.

From Bruker Nano Surfaces and Metrology 23 Mar 2010

Bruker Daltronics Introduce Entry Level amaZon Ion Trap Mass Spectrometer

Bruker Daltronics Introduce Entry Level amaZon Ion Trap Mass Spectrometer

Bruker Daltonics today announces the newest model in its successful amaZon™ ion trap mass spectrometry product line, the entry level amaZon SL. It builds upon Bruker’s long-standing expertise in high-performance ion trap technologies, and is designed to enhance efficiency for laboratories involved with applications including structural confirmation, compound screening and identification, process and general synthesis control, as well as metabolite identification.

From Bruker Nano Surfaces and Metrology 23 Mar 2010

Advanced Masterbatch and Compounding for Polymers and Plastics

Advanced Masterbatch and Compounding for Polymers and Plastics

Optimize compounding and masterbatch processes to boost efficiency while maintaining top material quality.

From AIMPLAS

AirBreather Platform for Continuous Gas Analysis

AirBreather Platform for Continuous Gas Analysis

AirBreather is the solution the gas monitoring challenges across applications.

From ASTG

SU7000 & SU8700 Schottky Field Emission SEMs: Ultra High-Resolution & Analytical Imaging

SU7000 & SU8700 Schottky Field Emission SEMs: Ultra High-Resolution & Analytical Imaging

Explore the SU7000 and SU8700 Schottky Field Emission SEMs, delivering ultra high-resolution imaging and advanced analytical capabilities.

From Hitachi High-Tech Europe

The Current State of the Global Semiconductor Market

The Current State of the Global Semiconductor Market

The global semiconductor market has entered an exciting period. Demand for chip technology is both driving the industry as well as hindering it, with current chip shortages predicted to last for some time. Current trends will likely shape the future of the industry, which is set to continue to show

How are Graphene Batteries Made?

How are Graphene Batteries Made?

The primary distinction between graphene-based batteries and solid-state batteries lies in the composition of either electrode. Although the cathode is commonly changed, carbon allotropes can also be employed in fabricating anodes.

What Role Will The IoT Play In The Electric Vehicle Industry?

What Role Will The IoT Play In The Electric Vehicle Industry?

In recent years, the IoT is rapidly being introduced into almost all sectors, but it has particular importance in the EV industry.

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