Jun 22 2007
PANalytical’s extensive range of X-ray fluorescence (XRF) spectrometers and reference standards provides elemental analysis of heavy metals in a wide variety of materials, including plastics, polymers, metals, brass, solder and wire. These advanced systems are enabling industry to meet the new challenges of stringent EU directives such as RoHS, WEEE and ELV. PANalytical systems support compliance not only with current regulations, but also provide the necessary levels of performance to allow for future, even tighter legislation.
PANalytical’s MiniPal 4 RoHS WEEE analyzer, a compact, benchtop EDXRF spectrometer, is specifically configured to analyze restricted elements in a wide range of sample types. The Epsilon 5 polarized energy dispersive XRF (EDXRF) spectrometer offers complete quantitative elemental analysis down to sub-ppm levels. The instrument is specifically designed for the analysis of heavy metals and supports the requirements of the directives, for example performing analysis of cadmium and lead in solders.
Axios wavelength dispersive XRF (WDXRF) spectrometers, configured in breakthrough, industry-tailored versions, meet the precise needs of a wide range of RoHS/WEEE applications.
TOXEL reference materials, developed in co-operation with DSM Resolve, are helping plastic and polymer manufacturers optimize XRF analysis for toxic heavy metals in polyethylene.
XRF spectroscopy is emerging as an optimal method to ensure compliance with environmental regulations such as RoHS and WEEE. There are several reasons for this trend: in contrast with other analytical techniques, XRF benefits from simple, essentially hazard-free, sample preparation. It is non-destructive, very rapid and inexpensive in terms of cost per analysis and demonstrates the necessary levels of sensitivity, accuracy and reproducibility.