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  • Iron Ore Trends for 2002
    Article - 3 Apr 2003
    The iron ore usage for 2002 is summarised. Of particular interest are the strength of the Chinese and Japanese steel industries. Cost reductions across the industry are reported and the effect of...
  • Surface Analysis of a Failed Semiconductor Using XPS & ToFSIMS
    Article - 25 Feb 2003
    Methods like X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectroscopy (ToF-SIMS) are two highly sensitive surface analysis tools.
  • Supplier Data - Silicon (Si) (Goodfellow)
    Article - 13 Feb 2003
    After carbon, Silicon is the most abundant element on earth, the abundance being 277,000 ppm. Silicon is generally present as a silicate, these being found in many rocks, clays and soils.
  • Supplier Data - Arsenic (As) (Goodfellow)
    Article - 11 Feb 2003
    The occurrence, production and applications of arsenic are outlined. The mechanical, electrical, physical, thermal and atomic properties of arsenic are also listed.
  • Supplier Data - Germanium (Ge) (Goodfellow)
    Article - 7 Feb 2003
    Germanium is a metalloid element and member of the carbon group of elements. Its occurrence, abundance, extraction and applications our outlined. Physical, mechanical, electrical, thermal and atomic...
  • Supplier Data - Selenium (Se) (Goodfellow)
    Article - 6 Feb 2003
    Selenium is a low melting poiint metal. Its occurence, abundance, applications and properties such as mechanical, physical, electrical, thermal and other atomic properties are listed.
  • High Resolution Electron Microscope Capable of Atomic Resolution of Semiconductors
    Article - 14 Jan 2003
    Researchers from IBM and Nion have developed a high resolutioin electron microscope which is able to resolve individual atoms inside a material. Design aspects, how the microscope works, capabilities...
  • World Gold Trends for the Second Quarter 2002 - News Item
    Article - 29 Nov 2002
    The trends for gold across the world for the second quarter of 2002 are reported. Demand for investment and indutrial gold are reported as well as quantities traded. Affects of economic and industrial...
  • Chemical Vapour Deposition (CVD) - An Introduction
    Article - 31 Jul 2002
    Chemical vapour deposition is a technique whereby gaseous reactants can be deposited onto a substrate. There are several variations in the basic technique which can be used to deposit a wide range of...
  • Coating Thickness Measurement via X-Ray Fluorescence - Non-Destrictive Testing
    Article - 27 Jun 2002
    X-Ray fluorescence is probably best known for compositonal analysis. However, it can also be used as a form of non-destructive testing for measuring coating thickness. The basic system, technique and...

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