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  • Article - 11 Oct 2022
    AFM stands for atomic force microscopy and is a type of scanning probe microscope (SPM). SPMs use a probe to evaluate local characteristics such as friction, magnetism, and height. AFM acquires an...
  • Article - 26 Apr 2022
    What do we know about hot labs and their applications, the risks associated with them, as well as the rules and safety protocols that have to be followed while working in these labs?
  • Article - 6 Apr 2022
    This article from Inorganic Ventures details what ICP spectroscopy is and the importance of ICP spectroscopy calibration standards.
  • Article - 8 Mar 2022
    In this interview, AZoM talks to Anna Walkiewicz, Applications Specialist at Quorum Technologies, about sample coating and how it can help improve SEM imaging.
  • Article - 16 Nov 2021
    Peoples Gas, the natural gas provider for Chicago, has cut methane emissions while boosting gas pipeline safety with innovative leak detection thanks to ABB’s innovative gas leak detection and...
  • News - 1 Mar 2010
    With a track record of launching 'industry firsts' X-ray analytical instrument manufacturer, PANalytical (Almelo, The Netherlands), raised the bar again in both XRF and XRD at this year's...
  • News - 18 Feb 2010
    At a meeting this week of the American Physical Society in Washington, MIT Associate Professor of Physics Bernd Surrow reported on new results from the STAR experiment at the Relativistic Heavy Ion...
  • News - 14 Feb 2010
    While many of us enjoyed constructing little houses out of toy bricks when we were kids, this task is much more difficult if bricks are elementary particles. It is even harder if these are particles...
  • News - 26 Jan 2010
    Researchers at the Joint Quantum Institute (JQI), a collaboration of the National Institute of Standards and Technology and the University of Maryland at College Park, can speed up photons (particles...
  • Article - 11 Jan 2021
    Dynamic light scattering (DLS) is key for analyzing CMP slurry particle size and zeta potential, with the Nicomp system and AccuSizer SPOS being optimal tools.

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