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  • Webinar - 8 Oct 2020
    You are warmly invited to Bruker’s multi-part free-of-charge R&D webinar series on “FT-IR Emission Spectroscopy”.
  • Webinar - 22 Jan 2019
    Spectroscopic ellipsometry is a surface sensitive, non-destructive, and non-intrusive optical metrology technique widely used to determine thin film thickness and optical constants (n, k).

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