The Elimination of the Memory Effect in OES

The Memory effect is up to today a common challenge in spark generated Plasma Optical Emission Spectroscopy (Spark-OES). It refers to the presence of residual analyte residues from previous samples (especially if their concentration is relatively high compared to the following sample), which can potentially result in “artificially” high outcomes and compromised analytical accuracy.

To ensure reliable and precise measurements, it is crucial to comprehend the concept of memory effect and implement effective strategies for its mitigation. Join this seminar to understand the memory effect and how it used to be handled in the past and how the new ARL iSpark Plus eliminates this effect.

Presenter

Wilhelm Sanders studied Physical engineering at the Rheinische Akademie in Cologne where he gained his first experience with optical emission spectrometers, which also ignited his passion for this technology. Since then, for more than 30 years, Wilhelm has worked in this field for various companies and roles. First in applications, then in automation, and later in service and sales and finally as Product Manager. Since 2021, Wilhelm is working in this role for Thermo Fisher Scientific, as the task of developing high-resolution "high-end" spark spectrometers really appealed to him. What he likes about this role is that it enables close contact with our customers and interaction with research and development.