Webinars | EDS

EDS Webinars

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An Overview of the Principles of SEM and EDS

EDS Webinars

Advanced Tools for Enhanced EBSD Data Collection and Analysis

In this webinar, we will showcase the features and performance of the Velocity Ultra, OIM Analysis v9, and Spherical Indexing.

From Gatan, Inc. 27 Jan 2025

An Overview of the Principles of SEM and EDS

The primary focus of this webinar is to explain the basics of SEM and EDS and the associated benefits.

From JEOL USA, Inc. 6 Nov 2024

Harnessing the Power of Spherical Indexing with EDAX OIM Matrix

In this webinar, we will delve into the applications of spherical indexing within the OIM Matrix™ extension.

From Gatan, Inc. 17 Oct 2024

Understanding and Reducing Errors in Strain Measurements with HR-EBSD

Modern diffraction-based tools, from micro-focus X-ray diffraction (XRD) to electron microscopy-based techniques, enable multi-scale residual strain quantification.

From Gatan, Inc. 18 Apr 2024

Correlative Microscopy with EBSD

This webinar will guide you step-by-step on using the tools in EDAX OIM Analysis™ to correlate EBSD data with other imaging modalities.

From Gatan, Inc. 6 Feb 2024

Applications of EBSD in Analyzing Deformed High-Temperature Materials

This webinar highlights three case studies demonstrating its application to high-temperature materials, conducted at the Center for Electron Microscopy and Analysis (CEMAS) at The Ohio State University.

From Gatan, Inc. 19 Dec 2023

$Introduction to Electron Backscatter Diffraction (EBSD)$

Introduction to Electron Backscatter Diffraction (EBSD)

This webinar will provide an introduction to the EBSD technique, exploring the relationship between diffraction physics and crystallography.

From Gatan, Inc. 3 Oct 2023

Addressing EBSD Indexing Challenges with Spherical Indexing

Traditionally, electron backscatter diffraction (EBSD) patterns have been indexed in OIM Analysis™ using the Hough Transform to detect bands in the patterns, combined with various band triplet indexing methods.

From Gatan, Inc. 28 Sep 2023

The Impact of Deformation Mode on Recrystallization Kinetics in Ni and Ti

This webinar will explore the impact of deformation mode (rolling vs. torsion) on microstructural heterogeneities and recrystallization kinetics in commercial purity Ni and Ti.

From Gatan, Inc. 5 Jul 2023

Advancements in EDS and EBSD

Join this webinar to explore how advancements in energy dispersive spectroscopy (EDS) and electron backscatter diffraction (EBSD) can enhance your analysis.

From Gatan, Inc. 24 Apr 2023

Introducing APEX 3.0 Software: EDS, EBSD, and WDS Integration

The new APEX 3.0 software is a comprehensive materials characterization suite that seamlessly integrates energy dispersive spectroscopy (EDS).

From Gatan, Inc. 29 Mar 2023

Making EDS Quantification with Standards an Everyday Technique Using FSQ in APEX

This webinar introduces how APEX simplifies this process with the "reference" feature.

From Gatan, Inc. 22 Feb 2023

EBSD and TKD for Deeper Insights into the Cold Spray Deposition Process

This presentation will highlight two examples demonstrating how EBSD and related techniques enhance our understanding of the cold spray process.

From Gatan, Inc. 8 Dec 2022

Quantifying Lithium Content Using the Composition by Difference Method

In this webinar, we introduce an innovative technique poised to transform lithium materials research: the Lithium Composition by Difference Method (Li-CDM).

From Gatan, Inc. 6 Jul 2022

$Applications of Direct Detection in Electron Backscatter Diffraction$

Applications of Direct Detection in Electron Backscatter Diffraction

In this webinar, the features and capabilities of the Clarity EBSD Detector Series will be highlighted, along with a variety of application examples showcasing its versatility.

From Gatan, Inc. 25 May 2022

EDS in the TEM: Fundamentals and Principles

While the vast majority of Energy Dispersive X-ray Spectroscopy (EDS) systems are mounted on Scanning Electron Microscopes (SEM), the incorporation of an EDS system on a Transmission Electron Microscopes (TEM) gives access to the same wealth of compositional information but on a scale much smaller than what is achievable in the SEM.

From Gatan, Inc. 10 Apr 2019

Applications of High-Speed CMOS Cameras for EBSD Microstructural Analysis

The recent adoption of CMOS-based cameras for the collection of Electron Backscatter Diffraction (EBSD) patterns has unlocked faster collection speeds at higher pixel resolution

From Gatan, Inc. 10 Apr 2019

A technology breakthrough: why CMOS-based detectors are changing the way we use EBSD

Following its launch in early 2017, the Oxford Instruments Symmetry® EBSD detector has made a significant impact in the microanalysis community.

From Oxford Instruments NanoAnalysis 25 Apr 2018

How to Use Saved EBSD Patterns in Specific Applications

In this webinar, we discuss possible applications using these saved EBSD patterns, including phase differentiation using ChI-Scan™, microstructural imaging using PRIAS™, improved indexing performance using NPAR™, advanced pattern indexing, and HR-EBSD

From Gatan, Inc. 14 Dec 2017

AZtecLive: A revolutionary approach to SEM-EDS Analysis

See how AZtecLive can radically change the way you approach sample investigation in the electron microscope.

From Oxford Instruments NanoAnalysis 6 Dec 2017

When and How to Use ChI-Scan™ in OIM Analysis™ v8

The tools available in OIM Analysis™ are always being updated and improved upon. With the recent release of OIM Analysis™ v8, the full suite of indexing options is now available outside our data collection software suites, including ChI-Scan™.

From Gatan, Inc. 16 Nov 2017

How to Use NPAR™ in OIM Analysis™ v8

With more and more users seeing the power of NPAR™, EBSD Applications Engineer Shawn Wallace, shows you how to use NPAR™ inside OIM Analysis™ v8. He covers all steps involved including how to make and tweak backgrounds, how to change phases, how to recalibrate data sets, and every other step involved in getting the most of your data.

From Gatan, Inc. 20 Jul 2017

Advances in EDS Throughput - From X-ray Counts to Solutions

Ongoing advancements in energy dispersive spectroscopy (EDS) analysis are leading to higher count rates, better light-element sensitivity, and improved energy-resolution stability over a wide range of count rates. In this webinar we briefly review how the different parts of the EDS system interact, from X-rays leaving the sample to the production of useful data and where recent improvements have taken place.

From Gatan, Inc. 16 Mar 2017

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