Webinars | Microscopy

Microscopy Webinars

Promoted Webinars

Discover How to Perform Advanced SEM Sample Preparation for Air-sensitive Materials

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Microscopic defect analysis in electroplating using laser induced breakdown spectroscopy

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Next Frontier - CryoEM for Quantum Materials and Energy Research

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Introducing ChemiSEM - The Complete Tool for Understanding Failure Analysis

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Determining Geological Processes via Multi-Scale X-ray and Electron Imaging Coupled to Machine Learning and Numerical Simulation

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Mineralogic 3D: High Resolution Automated Mineralogy in 3D

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AI-driven Reconstruction Technologies Enable Next Generation XRM Imaging: Increase Throughput and Enhance Image Quality

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3D Crystallographic Tomography: A Revolutionary New Lab Technique to Image Grain Microstructure

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Taking Rocks to the Cloud: Digitizing Thin Sections. A giant leap to a new world of digital petrography

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Microscopy Webinars

Exploring the Range of Electron Microscopes

Discover the results from a cold FEG-equipped CryoARM200 electron microscope, demonstrating how 200 kV data can produce sub-2Å structures.

From JEOL USA, Inc. 7 Nov 2024

Visualizing Biomolecules through High-Resolution Cryo-EM

Cryo-EM techniques such as single particle analysis allow structure determination of biomolecules.

From JEOL USA, Inc. 7 Nov 2024

STEM Imaging Techniques of Energy Materials

Discover the recent developments in STEM-based characterization techniques of relevant battery and other energy materials.

From JEOL USA, Inc. 7 Nov 2024

Particle Analysis in Scanning Electron Microscopy

JEOL's dedicated particle analysis software automates the detection and EDS analysis of particles, inclusions, or grains.

From JEOL USA, Inc. 7 Nov 2024

IDES Technology for Transmission Electron Microscopy

The primary focus of IDES technology is on bringing time resolution to transmission electron microscopy.

From JEOL USA, Inc. 7 Nov 2024

JEM-1400Flash Transmission Electron Microscope

JEOL has set up remote viewing and remote-control microscopy on Delta’s new 1400Flash transmission electron microscope.

From JEOL USA, Inc. 7 Nov 2024

The Latest in IDES Products for Time-Resolved TEM

This virtual panel discussion focuses on the exciting technologies enabled by the latest in IDES products for time-resolved TEM.

From JEOL USA, Inc. 7 Nov 2024

Exploring CRYO ARM™ Field Emission Cryo-Electron Microscopes

Explore the latest offerings in cryo-TEMs to facilitate the development of cryo-EM with the CRYO ARM™ Field Emission Cryo-electron Microscope.

From JEOL USA, Inc. 7 Nov 2024

The Past, Present and Future of High Resolution Cryo-EM

The advent of direct electron detectors led to a dramatic improvement in the resolution of cryo-EM structures.

From JEOL USA, Inc. 7 Nov 2024

Introducing the GRAND ARM™2: A High Performance Analytical S/TEM

JEOL is pleased to introduce the JEM-ARM300F2 GRAND ARM™2 for high-performance analytical S/TEM.

From JEOL USA, Inc. 7 Nov 2024

SEM Imaging: Recent Advances in Low kV Imaging and Microanalysis

Gain a deeper understanding of SEM imaging and the recent advances in low kV imaging and microanalysis.

From JEOL USA, Inc. 7 Nov 2024

Discover How to Perform Advanced SEM Sample Preparation for Air-sensitive Materials

This webinar from Thermo Fisher introduces the CleanMill Broad Ion Beam System, an advanced SEM sample preparation for traditional and air-sensitive materials.

From Thermo Fisher Scientific – Electron Microscopy Solutions 29 Mar 2023

Microscopic defect analysis in electroplating using laser induced breakdown spectroscopy

This webinar titled, Microscopic defect analysis in electroplating using laser induced breakdown spectroscopy (LIBS), will present how typical defects on electroplating products can be quickly analyzed with the LIBS technology to identify the (contamination) root cause.

From Leica Microsystems GmbH 20 Sep 2022

AFM Imaging and Beyond: A Practical Guide to AFM Modes for Materials Research

In this webinar, Bruker AFM experts will showcase the growing suite of AFM operational modes for nanoelectrical, nanomechanical, and nanochemical property measurement, with special attention paid to the modes most frequently used in leading-edge research and the combined use of multiple AFM modes.

From Bruker Nano Surfaces and Metrology 6 Sep 2022

Next Frontier - CryoEM for Quantum Materials and Energy Research

This webinar forum will present different approaches to maintaining sample integrity during electron microscopy studies and will feature a discussion on future directions in this field, for example use of cryoEM techniques for materials science applications.

From Thermo Fisher Scientific – Electron Microscopy Solutions 9 Jun 2022

Introducing ChemiSEM - The Complete Tool for Understanding Failure Analysis

New webinar: Introducing ChemiSEM – The Complete Tool for Understanding Failure Analysis. Learn how Thermo Scientific ChemiSEM Technology offers a leap forward in usability, convenience, and speed of analysis.

From Thermo Fisher Scientific – Electron Microscopy Solutions 5 May 2022

Determining Geological Processes via Multi-Scale X-ray and Electron Imaging Coupled to Machine Learning and Numerical Simulation

New Webinar: The key to most subsurface processes is to determine how structural and topological features at small length scales, i.e., the microstructure, control the effective and macroscopic properties of earth materials.

From Carl Zeiss Raw Materials 14 Apr 2022

The Future of Advanced Analytical Scanning Transmission Electron Microscopy

Explore the future direction of advanced analytical scanning transmission electron microscopy.

From JEOL USA, Inc. 24 Mar 2022

Mineralogic 3D: High Resolution Automated Mineralogy in 3D

3D mineralogy represents a disruptive technological advance, providing a much reduced time to actionable data. In this webinar, Eddy Hill, PhD describes the What, How, and Benefits of mineral classification and measurement in 3D.

From Carl Zeiss Raw Materials 9 Dec 2021

AI-driven Reconstruction Technologies Enable Next Generation XRM Imaging: Increase Throughput and Enhance Image Quality

In this webinar, you will learn how some of the biggest challenges associated with X-ray microscopy are tackled with the help of Artificial Intelligence (AI)-driven algorithms.

From Carl Zeiss Raw Materials 7 Sep 2021

The One-Minute-Way to fly's eyes morphology - Optical Profilometry provides topography of Drosophila's compound eye

TopMap Micro.View+ - the innovative high-end optical profiler by Polytec opens up entirely new possibilities regarding topography and surface texture measurements. This presentation introduces the advanced world of nature-made microlens arryas (on bent surfaces) using this new CSI microscope. An experimental physicist talks about his intuitive approach demonstrating the operational performance of this new product and the resulting opportunities for scientists and future end-users exemplified by

From Polytec 22 Jul 2021

3D Crystallographic Tomography: A Revolutionary New Lab Technique to Image Grain Microstructure

In this webinar, we will introduce the groundbreaking laboratory based non-destructive 3D crystallographic grain mapping technique called diffraction contrast tomography (DCT) and present compelling applications examples on a wide variety of materials.

From Carl Zeiss Raw Materials 23 Jun 2021

Taking Rocks to the Cloud: Digitizing Thin Sections. A giant leap to a new world of digital petrography

Taking Rocks to the Cloud: Digitizing Thin Sections. A giant leap to a new world of digital petrography. In this webinar, Matthew Andrew, PhD discusses how to bring petrography – the art and science of looking at rock thin sections – into the digital era.

From Carl Zeiss Raw Materials 6 May 2021

Can Direct Electron Detection be Used to Improve EBSD Analysis?

Electron Backscatter Diffraction (EBSD) is a very important microanalytical technique to measure and understand the crystallographic arrangements in materials.

From Gatan, Inc. 15 Apr 2019

Overlay and Organize Images From Any Source to Connect Your Multi-modal Data

Watch the webinar and learn how to use ZEISS ZEN Connect software to analyze your multi-modal microscopy data in context. Get unique insights, gain efficiency and save time – no matter whether you are a materials researcher at university, a multi-user facility or an industrial lab.

From Carl Zeiss Microscopy GmbH 10 Apr 2019

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