The EDAX Trident system integrates the latest advancements in energy dispersive X-ray spectroscopy (EDS), electron backscatter diffraction (EBSD), and wavelength dispersive spectroscopy (WDS) into a single analytical tool. Powered by the user-friendly EDAX APEXTM software, each technique can be individually optimized or seamlessly combined for enhanced integration. This allows for comprehensive data collection and efficient sharing of results across different analytical methods.
Benefits
- Improve the accuracy of results by collecting compositional and crystallographic orientation data in a single, easy-to-use package.
- Expand analytical capabilities to cover a wide range of materials, including complex samples.
- Obtain results in minutes rather than hours or days.
- Correlate with other techniques for the most comprehensive analysis available.
- Reduce operator error and avoid analysis pitfalls by streamlining workflows through simultaneous data collection.
Figure 1. a and b) EBSD orientation maps were collected at >3,000 indexed points per second using a Velocity Plus EBSD detector. c) Elemental map by EDS was collected simultaneously with EBSD data using an Octane Elect Super detector. Colorized to display copper (red), iron (green), and nickel (blue). d and f) Phase maps were determined from data. Colorized to display copper (top – blue, bottom – orange) and Kovar (top – yellow, bottom – green). Image Credit: Gatan, Inc.
Trident is designed with the understanding that advancements in modern materials require a detailed analysis of composition and crystallography to uncover the structure-function relationship. Whether identifying trace element segregation at grain boundaries in solar cell technologies or characterizing inclusions in steel, accurately determining crystal structure and composition—down to trace element levels—requires a multi-technique approach.
Trident integrates EDS, WDS, and EBSD detectors into a single, easy-to-use software platform, delivering the most comprehensive understanding of your samples.
Crystallographic data is captured using the latest EDAX EBSD systems, and when combined with compositional information from EDS via the Chi-ScanTM feature, indexing EBSD patterns becomes more efficient, reducing acquisition and analysis times by more than 10x.
Expanding characterization further, WDS detection enables the identification of elements at trace levels (as low as 0.1 wt. %), providing deeper insights into your materials.
Figure 2. a) An SEM image of a steel sample. The b) cobalt and c) iron elemental maps using EDS analysis. d) The boron elemental map using WDS analysis. Image Credit: Gatan, Inc.