EDAX EDS is the most intriguing and practical analytical tool for scanning transmission electron microscope (STEM) applications.
Features:
The EDAX EDS powered by Gatan provides completely integrated data capture and signal processing, along with characteristics to aid in configuration and evaluation. The Elite T silicon drift detector optimizes light element performance and maximizes collection efficiency, while DigitalMicrograph® (DM) software is the industry standard for TEM/STEM experimental analysis and control throughout a wide range of image analysis and analytical techniques.
This potential combination enables users to receive the best possible results in difficult conditions.
Elite T Silicon Drift Detector
- Compact sensor geometry allows the user to get nearer to the sample, boosting solid angle and count rates for the rapid data collection on sensitive samples
- Provides excellent resolution and minimal peak shift at all count rates for optimal deconvolution, as well as an extremely high count rate for quick mapping and time to data.
- Employs a windowless design to get better sensitivity for low energies as low as Al L
DigitalMicrograph Software
- Full DM integration offers a robust, multi-dimensional, one-stop analysis of data and visualization platform for all TEM/STEM applications
- Allows users to customize the analysis with native support for DM scripting and Python programming
- Makes use of fully customizable data capture and a single palette to accurately maintain and simplify all acquisition workflow: areas, lines, points, and time series
- Multimodal capability combines all STEM data, such as energy dispersive spectroscopy (EDS), 4D STEM, electron energy loss spectroscopy (EELS), cathodoluminescence (CL), and imaging, on a unified platform