The Hitachi SU3800SE and SU3900SE scanning electron microscopes provide an imaging and analytical solution for diverse applications. These instruments provide high-resolution imaging, simple sample navigation, and powerful automation features, resulting in dependable, consistent findings across a variety of application scenarios.
Whether users need to work with regular samples or larger industrial materials, these SEMs provide the adaptability and stability required to support the lab's aims. The SU3800SE and SU3900SE are ideal for both research labs and industrial applications, as they help reduce data turnaround time, increase productivity, and ensure reproducible results.
Features
Can Handle a Wide Range of Sample Sizes
Image Credit: Hitachi High-Tech Europe
- Both the SU3800SE and SU3900SE have robust, precise eucentric 5-axis specimen stages
- SU3900SE can accommodate specimens up to 300 mm in diameter, 130 mm in height, and 5 kg in weight. Users can navigate along all five stage axes. Ideal for imaging huge, heavy industrial materials like automotive components without having to trim them down to smaller sizes, which saves time. Alternatively, users can accommodate several samples, such as up to 11 filters with a diameter of 47 mm for long-term automated inspections
- SU3800SE: Designed for smaller specimens of up to 200 mm in diameter, 80 mm in height, and 2 kg weight. Provides the necessary versatility for generic sample analysis in a wide range of fields
- These SEMs are capable of handling both normal lab samples and big industrial materials
Effortless Navigation and Precision Control
Image Credit: Hitachi High-Tech Europe
- The motorized, eucentric 5-axis stage (X, Y, Z, tilt, and rotation) allows for complete control over specimen orientation
- The automatically activated stage collision model offers worry-free navigation
- The advanced optical camera system captures the complete spectrum of motion, allowing for precise and easy navigation throughout large samples
- Improve observation capabilities with smooth specimen navigation, resulting in accurate and consistent imaging every time
High-Resolution and Auto-Aligned Imaging for Consistent, High-Quality Results
Image Credit: Hitachi High-Tech Europe
- The Schottky field emission-powered optics do not interact with the specimen magnetically or electrically. Thus, these microscopes provide consistently outstanding imaging performance over a wide range of specimens
- A variable pressure mode is included as standard. This allows for easy observation and high-current analysis of non-conductive samples without requiring further sample preparation
- The optics’ auto-alignment functions are fast and accurate. Thus, novice operators can achieve high-quality output rapidly.
Automated Workflows Free Your Time for Other Work
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- The EM Flow Creator tool automates repetitive imaging processes, minimizing operator workload
- Configure bespoke observation recipes that include magnification, focus, stage position, and other parameters to ensure consistent, high-quality observations with minimal user effort
- Ideal for labs looking to improve efficiency and reproducibility in their imaging operations
Applications Gallery
Metals
Fracture surface of iron wire. Microcavitation due to ductile failure can be seen. Image Credit: Hitachi High-Tech Europe
SUS316. Line-like contrast suggestive of dislocations can be seen. Image Credit: Hitachi High-Tech Europe
Electronic Components
Printed circuit board. The 3D shapes and positions of mounted components can be seen using low magnification/high-tilt observation. Image Credit: Hitachi High-Tech Europe
Cross section of layered ceramic capacitor. The composition and crystal contrast of nickel electrodes/dielectric layer can be observed. Image Credit: Hitachi High-Tech Europe
Inorganic Materials
Zinc oxide particles. Fine particles with sizes of about 50 nm and 3D shape can be seen. Image Credit: Hitachi High-Tech Europe
High-entropy carbide film. Distribution of particles with different compositions/shapes can be seen. Image Credit: Hitachi High-Tech Europe
Batteries
Lithium-ion battery cathode material. Distributions of cathode material particles and surrounding binder can be seen. Image Credit: Hitachi High-Tech Europe
Lithium-ion battery anode material. Lithium-ion battery anode material and binder is clearly distinguished using static voltage contrast. Image Credit: Hitachi High-Tech Europe
Specifications
Source: Hitachi High-Tech Europe
| Item |
SU3900SE/SE Plus |
SU3800SE/SE Plus |
| Electron Optics |
Secondary Electron Image resolution |
0.9 nm @ 30 kV |
| 2.5 nm @ 1 kV |
| 1.6 nm @ 1 kV (*1) (*2) |
| Magnification |
5～600,000× |
| Electron Gun |
ZrO/W Schottky Emitter |
| Accelerating Voltage |
0.5 kV～30 kV |
| Landing Voltage (*1) (*2) |
0.1 kV～2 kV |
| Detectors |
Standard Detectors |
Secondary Electron Detector (SED) |
| TOP detector (TD) (*2) |
| 41+1-segment Semiconductor Type Backscattered Electron Detector (BSED) |
| Optional Detector (*3) |
Ultra Variable Pressure Detector (UVD) |
| Specimen Stage |
Stage Control |
5-axis Motor Drive |
| Movable Range |
X |
0～150 mm |
0～100 mm |
| Y |
0～150 mm |
0～50 mm |
| Z |
3～85 mm |
3～65 mm |
| T |
-20～90° |
| |
|
R |
360° |
| Specimen Chamber |
Mountable Specimen Size |
Max. φ 300 mm |
Max. φ 200 mm |