Materials Research News

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TMS2013 Highlights Role of Materials Science to Address Global Challenges

TMS2013 Highlights Role of Materials Science to Address Global Challenges

New PI miCos MCS XY Precision Linear Stage for Industrial Metrology Applications

New PI miCos MCS XY Precision Linear Stage for Industrial Metrology Applications

Olympus Adds New Capability to IX83 Inverted Microscope Frame

Olympus Adds New Capability to IX83 Inverted Microscope Frame

New Partnership between AB SCIEX and LECO Corporation - Offering Combined Solutions for GC/MS and LC/MS

Brooks Instrument Launches Upgraded GF 40/80 Series - Thermal Mass Flow Controllers

Oxford Instruments Plasma Technology Launches PlasmaPro1000 Astrea System for Batch production of HBLED

Zwick USA to Demonstrate Industry Leading Textile Materials Testing Solutions at Techtextil North America 2013

Professor Nafie from Syracuse University to Receive Wiley-Pittcon Spectroscopy Award 2013

Carl Zeiss Showcases High-Performance Optical and Electron Microscopy Products at PITTCON 2013

Carl Zeiss Showcases High-Performance Optical and Electron Microscopy Products at PITTCON 2013

HORIBA Scientific Unveils New XploRA ONE Raman Microscope

HORIBA Scientific Unveils New XploRA ONE Raman Microscope

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